Semiconductor microcavity polaritons

Wannier-Stark effect and electron-phonon interaction in macroporous silicon structures with SiO2 nanocoatings

“…It should be noted that impurities increase the density of the polariton states too [13]. Absorption of macroporous silicon samples without oxi− dation and oxide removal exceeds 4-20 times that of macro− porous silicon samples with previous cleaning.…”

“…A series of light absorption bands at w ³ w LO can be explained by the formation of multi−phonon states as a result of the interaction of phonons of the SiO 2 film with waveguide modes in the silicon matrix [13]. It is known that the surface LO phonons are phonon polaritons [14], thus the waveguide modes increase the density of the polariton multi−phonon states [13]. As a result, absorption increases as the frequency (w S + ) N of the N−th mode of sur− face phonon−polariton coincides with the frequencies of the waveguide modes.…”

Phonon polariton modes in porous III–V semiconductors

“…Some of the areas of current interest are (i) photonic polaritonic materials [5], (ii) left handed materials [6], (iii) porous semiconductor materials [7,8], (iv) microcavity polaritons [9], and (v) those associated with acoustic modes in a piezoelectric material [10,11]. Some of these phenomena are made use of in devices for supporting spontaneous emission, for projecting light along a specific path in novel laser geometry and in efficient frequency conversion [12][13][14] and so on.…”

Vibrational polaritons in thin oxide and nitride films

“…In the optical region the polaritons are studied as a rule by Raman scattering [1]. But reflectivity spectra widely used to study thin films on opaque substrates can be applied too [2][3][4]. As a rule the reflection spectra of such samples have two types of absorption bands: 1 -absorption at frequencies of dipole vibrations in the film material; 2 -a set of interference bands because the film looks like the Fabri-Perot interferometer.…”

“…The dispersion of interference polaritons (Fabri-Perot or cavity modes) is different from dispersion of vibrational (phonon) polaritons. If these spectra are measured at several angles of incidence θ (k x = k 0 sin(θ), k 0 =ω/c), the information about the film polariton dispersion can be obtained [3,4], and the film vibrational frequencies, thickness and refractive index can be drawn. We have studied the dispersion of the radiative polariton modes in the thin films of silicon oxinitride and aluminum oxide on silicon and metal substrates respectively.…”