“…63 This procedure has been successfully employed on different materials like TiO2, 62 Silicon, 64 conducting polymers, 65 etc. The obtained DOS, in good agreement with previous reports for highly defective Ni(OH)2/NiOOH electrocatalysts, 58 reflects an increase of the density of catalytic sites for films baked at lower temperatures, with a higher density of structural/electronic defects (oxygen vacancies) as confirmed by XRD, TEM, Raman, conductivity and PL. Furthermore, it has been recently reported that amorphous Ni-based catalysts can expose bulk catalytic active sites, leading to a higher OER activity, while their crystalline counterpart only exposes surface sites.…”