2006
DOI: 10.1109/tsm.2005.863248
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Sheet Resistance Measurement of Non-Standard Cleanroom Materials Using Suspended Greek Cross Test Structures

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Cited by 46 publications
(24 citation statements)
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“…The Greek crosses that are visible in the test set in Fig. 1 are used to measure the sheet resistance R S [23]. The average value of the measured R S was 90 mΩ corresponding to 1.1E07 S/m conductivity for 1-µm conductor thickness.…”
Section: Test Structuresmentioning
confidence: 99%
“…The Greek crosses that are visible in the test set in Fig. 1 are used to measure the sheet resistance R S [23]. The average value of the measured R S was 90 mΩ corresponding to 1.1E07 S/m conductivity for 1-µm conductor thickness.…”
Section: Test Structuresmentioning
confidence: 99%
“…The electrical properties of the dielectric and conductor layers are listed in Table 1. The parameters for the conductor were obtained from the average dc sheet resistance R s = 40 mΩ/ measured from 10 Greek cross [17] test structures. Highfrequency analysis with multiline characterization method [18][19][20] [21] confirmed the validity of using the dc value at 2.4 GHz.…”
Section: Design Methodsmentioning
confidence: 99%
“…In practice, this is not possible (Figure 2.5). Enderling and co-workers [78] proposed to use suspended Greek Crosses to overcome this problem. However, this is only suitable for films with a poor step coverage (e.g.…”
Section: Motivationmentioning
confidence: 99%
“…The correction factors are obtained using the mathematical technique described in [78] and verified using a finite element analysis method.…”
Section: Extracted Sheet Resistancementioning
confidence: 99%