1996
DOI: 10.1063/1.116847
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Si/SiO2 resonant cavity photodetector

Abstract: It has been shown earlier that GeSi/Si resonant-cavity photodiodes can achieve high speed without sacrificing quantum efficiency. In this letter, we report a Si-based resonant-cavity photodiode that utilizes a Si/SiO2 Bragg reflector. This structure is more compatible with standard Si processing technology than the GeSi/Si resonant-cavity photodiodes. The absorbing region is a 1-μm-thick polysilicon layer that has been annealed to enhance secondary grain growth and the bottom mirror consists of three quarter-w… Show more

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Cited by 25 publications
(8 citation statements)
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“…Numerous attempts have been made to fabricate Si RCE photodetectors [6]. Earlier devices utilized Si device structures deposited on top of dielectric mirrors.…”
Section: Introductionmentioning
confidence: 99%
“…Numerous attempts have been made to fabricate Si RCE photodetectors [6]. Earlier devices utilized Si device structures deposited on top of dielectric mirrors.…”
Section: Introductionmentioning
confidence: 99%
“…But this also means longer transit times which will degrade the high-speed performance of the devices. Resonant cavity enhanced (RCE) photodetectors potentially offer the possibility of overcoming this limitation of the bandwidthefficiency product of conventional photodetectors [5]- [8]. The RCE detectors are based on the enhancement of the optical field within a Fabry-Perot resonant cavity.…”
Section: Introductionmentioning
confidence: 99%
“…Several attempts have been made to fabricate silicon RCE photodetectors [2], [3]. Earlier devices utilized Si device structures deposited on top of dielectric mirrors.…”
mentioning
confidence: 99%