The transition process of a pure Sb thin film from amorphous to crystalline is ultrafast but thermally unstable. We fabricated Er doped Sb thin films by magnetron sputtering for the first time. By measuring the in situ film resistance vs. temperature, it was found that the crystallization temperature increased from 105 °C to 208 °C with increasing Er content, resulting in a significant improvement in the thermal stability. The phase transition speed was investigated using picosecond laser pulses, showing an ultrafast speed of ∼2 ns. SEM, EDS and XRD analyses also demonstrated the existence of Er and the improvement in the thermal stability by increasing Er-doping. The enhanced thermal stability through Er doping onto Sb thin films was attributed to the formation of Sb-Er bonds in doped films measured by XPS. The main outcomes of this work enable a prediction that the Er doped Sb thin films are well suited for data storage applications.
ExperimentalErbium doped Sb thin films of Er x Sb 1−x (0.002 ≤ x ≤ 0.018) were deposited on SiO 2 /Si (100) wafers by co-sputtering of Er and Sb targets at room temperature using magnetron sputtering. The purity of the Sb and Er targets was 99.999%. The base pressure in the deposition chamber was 2 × 10 −4 Pa. Sputtering was performed under an Ar gas pressure of 0.3 Pa, a flow of 30 SCCM, and a power of 30 W. The thin film