2019
DOI: 10.33693/2313-223x-2019-6-2-157-159
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Silicon-Lithium Δe-Detectors of Alpha-Radiation to the Radiometer

Abstract: The paper presents the optimization of the manufacturing technology of silicon-lithium Δ Ε -detectors of large size, as well as some research data on the radiometric characteristics of silicon-lithium Δ Ε -detectors with a diameter of 4-8 cm and a radiometer based on them.

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Cited by 3 publications
(2 citation statements)
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“…It is now known that ultrasonic irradiation affects the defect structure and electrophysical characteristics of semiconductors. Similar studies were carried out in detail for Si (Li) -p-i-n detectors [1,2], where it was shown that the energy resolution is significantly affected by irregularity of the silicon resistivity. Since the compensation process of the irregularity during the manufacture of DEDX (diffused junction semiconductor detector) -Si-n-p-detectors does not exist, there is no effect of self-regulation of the system (sensitive area), as in the case of lithium ion-drift.…”
Section: Introductionmentioning
confidence: 55%
“…It is now known that ultrasonic irradiation affects the defect structure and electrophysical characteristics of semiconductors. Similar studies were carried out in detail for Si (Li) -p-i-n detectors [1,2], where it was shown that the energy resolution is significantly affected by irregularity of the silicon resistivity. Since the compensation process of the irregularity during the manufacture of DEDX (diffused junction semiconductor detector) -Si-n-p-detectors does not exist, there is no effect of self-regulation of the system (sensitive area), as in the case of lithium ion-drift.…”
Section: Introductionmentioning
confidence: 55%
“…In the radiometer, heterojunction or surface-barrier detectors were used to measure the activity of alpha, beta particles, and volumetric radon activity. The development of technology for manufacturing various types of highly sensitive detectors is described in [Radzhapov et al 2018 MeV ~ 90 keV at temperature T = +27 0 C, which was determined mainly by capacitive noise.…”
Section: Methodsmentioning
confidence: 99%