2015
DOI: 10.1063/1.4914086
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Simple characterization of electronic processes in perovskite photovoltaic cells

Abstract: Electronic properties of perovskite lead-halide photovoltaic cells have been studied. The dc current/voltage characteristics were found to be well fitted by a standard diode equation under optical excitation and in the dark, while the impedance spectroscopy revealed a pronounced slow process under light illumination, which is absent in the dark. A simple model is proposed, which can explain all aspects of the observed behavior quantitatively and consistently.

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Cited by 45 publications
(42 citation statements)
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“…After cleaning the surface of the NiO x layer, the perovskite and PCBM layers were prepared and deposited as reported. 14,17,18 After Ag deposition, the devices were sealed by a glass plate. The current density-voltage (J-V ) characteristics was measured by a solar simulator system (Asahi Spectra Co. Ltd., California, USA).…”
Section: Methodsmentioning
confidence: 99%
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“…After cleaning the surface of the NiO x layer, the perovskite and PCBM layers were prepared and deposited as reported. 14,17,18 After Ag deposition, the devices were sealed by a glass plate. The current density-voltage (J-V ) characteristics was measured by a solar simulator system (Asahi Spectra Co. Ltd., California, USA).…”
Section: Methodsmentioning
confidence: 99%
“…The J-V curve of the cells containing PEDOT:PSS is ideally fitted by the one or two diode models. 14,15 Therefore, in case of PEDOT:PSS, we assumed that the electrons in the conduction band of the perovskite directly recombine with the hole in the valence band of PEDOT:PSS, or recombine through the in-gap recombination centers in the bulk perovskite (the ShockleyRead-Hall mechanism). On the other hands, the J-V curve of the cells containing NiO x is not ideal.…”
Section: Photovoltaic Propertiesmentioning
confidence: 99%
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“…Understanding the formation mechanisms in CH 3 NH 3 PbI 3 perovskite is of great importance for device design and optimization, 18 and in relating models of device performance 19 to material properties. However, CH 3 NH 3 PbI 3 films are typically characterized only by X-ray diffraction (XRD), and usually only by identifying the (110) and (220) diffraction peaks characteristic of the perovskite structure.…”
mentioning
confidence: 99%