1998
DOI: 10.1109/16.704357
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Simulation and design of InAlAs/InGaAs pnp heterojunction bipolar transistors

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Cited by 38 publications
(17 citation statements)
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“…A very good agreement is obtained for temperatures >150K (Menon et al, 2008a). Lee et al 1991 This work (77K) Sotoodeh et al 2000Arora et al 1982Pearsall 1981Ohtsuka et al 1988 1.E+02 Takeda et al 1981 This work The hole mobilities for InP-based material are similar to those seen for GaAs and AlGaAs (Datta et al, 1998). Carrier mobility decreases sharply when doping density is increased for low doping densities (less than 1e18 cm -3 ).…”
Section: Concentration-dependent Minority Carrier Lifetime Modelmentioning
confidence: 64%
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“…A very good agreement is obtained for temperatures >150K (Menon et al, 2008a). Lee et al 1991 This work (77K) Sotoodeh et al 2000Arora et al 1982Pearsall 1981Ohtsuka et al 1988 1.E+02 Takeda et al 1981 This work The hole mobilities for InP-based material are similar to those seen for GaAs and AlGaAs (Datta et al, 1998). Carrier mobility decreases sharply when doping density is increased for low doping densities (less than 1e18 cm -3 ).…”
Section: Concentration-dependent Minority Carrier Lifetime Modelmentioning
confidence: 64%
“…The mobility data has been fit to Eqs. (6) and (7) by Datta et al (1998) (6) and (7) using curve-fitting methodology where we obtained alphan.caug=0. 437, alphap.caug=0.9222, betan.caug=1.818, betap.caug=1.058, gamman.caug=2.526 and gammap.caug=7.659.…”
Section: Concentration-dependent Minority Carrier Lifetime Modelmentioning
confidence: 99%
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“…While modeling of HBT performance has been ongoing in InP/InGaAs, AIGaAs/GaAs or GaN-based systems [11][12][13], there has been no attempt at simulating HBT's in this pioneering material. In this work, we report on the simulation results of the InGaAsN-based HBTs with an emphasis on the challenging Pnp for use in assessing the factors maximizing device performances and in providing trends for the epitaxial multilayer structure to further extend the effectiveness of complementary HBT technology.…”
Section: Introductionmentioning
confidence: 99%
“…8, pp. 1634-1643, Aug. 1998field mobility model for III-V compounds applicable in device simulation codes," J. Appl. Phys., vol.…”
Section: Introductionmentioning
confidence: 99%