Simulation and physics of charged board model for ESD

Abstract

Currently sensitivity of electrical components to charged board model type electrostatic pulses is increasing. Therefore, accurate modeling of these pulses is important. This paper discusses the essential parameters of charged board model type ESD with measurements, 3-D electromagnetic simulations and circuit simulations and makes comparisons to the conventional methods.

Computational Simulation of a Field-Induced Charged Board Event Test Bench Using Transient Analysis

“…These inductive properties are used for reducing noise and are expressed by (4). The stray impedance of the voltage probe connecting the oscilloscope acts as a virtual low-pass filter, reducing the amplitude of the FICBE current waveform at high frequencies, as expressed by (5). The incorporation of ferrite beads results in a reduction of common-mode noise signals and shaping of the FICBE discharge current waveform to comply with the Charged Device Model (CDM) standard by increasing the series inductance.…”

“…This event is defined as the charged board event (CBE), which typically occurs in a field-induced charged board event (FICBE) [3], [4]. The major difference between CDM and CBM events is the high energy of capacitance in CBM [5], [6]. Currently, the FICBE test model is not a standard test method.…”

Investigation on Board-Level CDM ESD Issue in IC Products

“…Recently, the simulation of CBM ESD event had been performed to evaluate the discharging current under different charged-board dimensions [16]. In this section, different PCB sizes, charged voltages, and series resistances in the discharging path are measured to explore their effects on board-level CDM ESD events.…”