2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220)
DOI: 10.1109/ectc.2001.927890
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Simulation, modeling, and testing embedded RF capacitors in low temperature cofired ceramic

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Cited by 15 publications
(2 citation statements)
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“…Numerous methods for determining the highfrequency dielectric properties of functional materials were presented in the literature (e.g., Z -shrinkage [13,[25][26][27]). For the particular investigation of interest in this work, the capacitor evaluation method was used [28].…”
Section: Rf and Microwave Test And Evaluationmentioning
confidence: 99%
“…Numerous methods for determining the highfrequency dielectric properties of functional materials were presented in the literature (e.g., Z -shrinkage [13,[25][26][27]). For the particular investigation of interest in this work, the capacitor evaluation method was used [28].…”
Section: Rf and Microwave Test And Evaluationmentioning
confidence: 99%
“…SOP technologies used several substrates. So far, LTCC has been widely studied for SOP applications, since LTCC materials have low loss tangent, which it allows to make high Q embedded passive components [2][3][4]. However, they are limited to mass production and low cost due to the small size and the shrinkage of the ceramic substrate occurred during the firing process.…”
Section: Introductionmentioning
confidence: 99%