1991
DOI: 10.1049/el:19910975
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Simulations for improved heterostructure Gunn oscillator based on transit region doping variations

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Cited by 5 publications
(2 citation statements)
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“…Thus the doping level of the drift region was chosen to be much larger than typically used for GaAs or InP Gunn devices. 45,46 Since the mobility of GaN is lower in comparison to both GaAs and InP, the time required to build up a stable domain is higher for the same background doping. The higher doping chosen here helps offset the lower mobility value.…”
Section: Monte Carlo Simulation Detailsmentioning
confidence: 99%
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“…Thus the doping level of the drift region was chosen to be much larger than typically used for GaAs or InP Gunn devices. 45,46 Since the mobility of GaN is lower in comparison to both GaAs and InP, the time required to build up a stable domain is higher for the same background doping. The higher doping chosen here helps offset the lower mobility value.…”
Section: Monte Carlo Simulation Detailsmentioning
confidence: 99%
“…The room temperature value is higher than that reported for GaAs devices. 45 Finally, Monte Carlo simulations were performed for GaN diodes with multiple transit segments. The resulting power output as a function of the frequency is given in Fig.…”
Section: --T=300kimentioning
confidence: 99%