The
electronic properties of the graphene (Gr) Schottky junction with
an Al0.22Ga0.78N/GaN heterostructure on silicon
have been investigated, both by experiment and with use of ab initio
DFT calculations. A peculiarly high n-type doping (1.1 × 1013 cm–2), observed for Gr in contact with
AlGaN, was explained by the combined effect of Fermi level pinning
by AlGaN surface states and charge transfer. Spatially uniform current
injection across the Gr/AlGaN/GaN heterojunction was revealed by nanoscale
resolution conductive atomic force microscopy (CAFM) analyses. Furthermore,
a Gr/AlGaN/GaN Schottky diode with excellent rectifying behavior has
been demonstrated and used as the key building block for a hot electron
transistor (HET) with a 10 nm Al2O3 base-collector
barrier. Thanks to the highly efficient hot electron injection from
the AlGaN/GaN emitter, this transistor exhibits high on-state current
density (J
C,ON ≈ 1 A/cm2), high on-state over off-state current density ratio (J
C,ON/J
C,OFF ≈ 106), and a common-base current gain α ≈ 0.15, solely
limited by the high Al2O3 base–collector
barrier. The excellent performances of the Gr/AlGaN/GaN Schottky junction
represent an important step toward the development of a HET technology
compatible with the state-of-the-art GaN high electron mobility transistors.