Microwave dielectric loss tangent
measurements are demonstrated
as a method for quantifying trace sp
2
-hybridized carbon
impurities in sub-micron diamond powders. Appropriate test samples
are prepared by vacuum annealing at temperatures from 600 to 1200
°C to vary the sp
2
/sp
3
carbon ratio through
partial surface graphitization. Microwave permittivity measurements
are compared with those obtained using X-ray photoelectron spectroscopy
(XPS), Raman spectroscopy, and electron energy loss spectroscopy (EELS).
The average particle size remains constant (verified by scanning electron
microscopy) to decouple any geometric dielectric effects from the
microwave measurements. After annealing, a small increase in sp
2
carbon was identified from the XPS C 1s and Auger spectra,
the EELS σ* peak in the C 1s spectra, and the D and G bands
in Raman spectroscopy, although a quantifiable diamond to G-band peak
ratio was unobtainable. Surface hydrogenation was also evidenced in
the Raman and XPS O 1s data. Microwave cavity perturbation measurements
show that the dielectric loss tangent increases with increasing sp
2
bonding, with the most pertinent finding being that these
values correlate with other measurements and that trace concentrations
of sp
2
carbon as small as 5% can be detected.