Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2×1) with small oscillation amplitudes

Özer, H. Özgür; Atabak, Mehrdad; Ellialtioglu, R.; Oral, Ahmet

doi:10.1016/s0169-4332(01)00942-4

Cited by 10 publications

(4 citation statements)

References 7 publications

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“…In this work, we find that changes in the force gradient interaction occur before the tunnelling current is detected, as is shown in figure 2. This is unlike previous observations made on Si(111) and Si(100) where we found that tips that provided atomic resolution also provided an onset of tunnelling current well before the detection of a change in interaction stiffness [12,16,17]. Blunter tips with larger cone angle and vdW radius, which gave earlier force onset, would not resolve the short-range interactions, due to domination of long-range forces.…”

Section: Experiments and Resultscontrasting

confidence: 99%

Low-amplitude, force gradient imaging of Cu(100) surface using tunnel current feedback

Özer¹,

Norris²,

Oral³

et al. 2003

Nanotechnology

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The large corrugation amplitudes in scanning tunnelling microscope (STM) images of metal surfaces have been commonly attributed to the action of forces between the tip and the sample. We have investigated the Cu(100) surface using a high-resolution non-contact atomic force microscope/scanning tunnelling microscope (nc-AFM/STM) in UHV. Force gradient and STM topography images were acquired simultaneously using constant tunnelling current feedback. Force gradient images showed atomic resolution whereas STM scans exhibited almost no contrast, corresponding to a flat tip trajectory during scans. The corrugation height in force gradient images was found to increase as the set tunnelling current was increased. Force gradient and tunnel current were directly measured as a function of separation, to determine the operating conditions during imaging. The STM operation regime is found to lie between the minimum of the stiffness curve and the start of repulsive force.

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Section: Experiments and Resultscontrasting

confidence: 99%

Low-amplitude, force gradient imaging of Cu(100) surface using tunnel current feedback

Özer¹,

Norris²,

Oral³

et al. 2003

Nanotechnology

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“…However, in this study, the authors do not indicate which of the three possible chemical bonds, Ni−Ni, Ni−O, or O−O, is actually formed and broken during the experiments. Other studies − have investigated frequency changes and force gradients of the short-range chemical interactions of a tungsten tip with silicon surfaces at room temperature, using extremely stiff tungsten cantilever springs with k C > 100 N/m and an off-resonance dynamic measuring mode. However, force values are not given.…”

Section: 3 Mechanical Rupture Forces Of Single Chemical Bonds331 Cova...mentioning

confidence: 99%

Mechanochemistry: The Mechanical Activation of Covalent Bonds

2005

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“…Compared to the Si(111) surface, there has been a relative dearth of combined AFM/STM investigations of the Si(100) surface, particularly at low temperature. Previous studies have been limited in scope [7] or failed to resolve the fine detail of the surface (using STM feedback at room temperature) [29]. Little attention has been paid to the potential for combined AFM/STM to map the electronic properties of the surface and, there has, to our knowledge, not been a detailed combined AFM/STM study of defects on the Si(100) surface.…”

Section: Introductionmentioning

confidence: 99%

Imaging and manipulation of the Si(100) surface by small-amplitude NC-AFM at zero and very low applied bias

Sweetman¹,

Danza²,

Gangopadhyay³

et al. 2012

J. Phys.: Condens. Matter

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We use a noncontact atomic force microscope in the qPlus configuration to investigate the structure and influence of defects on the Si(100) surface. By applying millivolt biases, simultaneous tunnel current data is acquired, providing information about the electronic properties of the surface at biases often inaccessible during conventional STM imaging, and highlighting the difference between the contrast observed in NC-AFM and tunnel current images. We also show how NC-AFM (in the absence of tunnel current) can be used to manipulate both the clean c(4 × 2) surface and dopant-related defects.

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Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2×1) with small oscillation amplitudes

Cited by 10 publications

References 7 publications

Low-amplitude, force gradient imaging of Cu(100) surface using tunnel current feedback

Low-amplitude, force gradient imaging of Cu(100) surface using tunnel current feedback

Mechanochemistry: The Mechanical Activation of Covalent Bonds

Imaging and manipulation of the Si(100) surface by small-amplitude NC-AFM at zero and very low applied bias

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