Single Event Upset Characterization of GHz Analog to Digital Converters with Dynamic Inputs Using a Beat Frequency Test Method

Kruckmeyer, Kirby; Rennie, R.L.; Ostenberg, D.H.; Ramachandran, V.; Hossain, Tareq

doi:10.1109/redw.2007.4342550

“…The code error and beat frequency test method used in this study is described in detail in [4]. ADC08D1000WG-QV die, assembled in plastic packages for this study, were decapped and soldered to ADC08D1000DEV boards [4].…”

Section: Test Methodsmentioning

confidence: 99%

“…A test method has been previously demonstrated using a beat frequency and code error detection software so that an ADC could be tested with the input frequency close to 2 times Nyquist [4]. Using this method, the SEU signatures could be characterized over the full-scale input range and all output codes.…”

Section: Introductionmentioning

confidence: 99%

Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter

Kruckmeyer

¹

,

Rennie

²

,

Ramachandran

³

2008

IEEE Trans. Nucl. Sci.

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Typical test methods for characterizing the single event upset performance of an analog to digital converter (ADC) have involved holding the input at static values. As a result, output error signatures are seen for only a few input voltage and output codes. A test method using an input beat frequency and output code error detection allows an ADC to be characterized with a dynamic input at a high frequency. With this method, the impact of an ion strike can be seen over the full code range of the output. The error signatures from this testing can provide clues to which area of the ADC is sensitive to an ion strike.Index Terms-Analog-digital conversion, beat frequency, code error, single event upset.

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“…The REAG approach to .ADC SEE DP testing (otherwise known as Beat Frequency) [4][ 12] is to apply input excitation to the ADC clock and data connections from separate signal generators. The clock frequency (fs) is expected to gradually lag the data frequency (fd) such that the ADC output will slowly change.…”

Section: B Differential Points (Dp) Test Schemementioning

confidence: 99%

“…[4]) Clock and Data Waveforms. Actual clock is a sinusoid but is illustrated as a square wave for simplification of demonstrating sampling points.…”

Section: B Differential Points (Dp) Test Schemementioning

confidence: 99%

“…Over the years, various approaches have been used to test ADC SEE sensitivity [1)- [4). The plethora of approaches is a direct result of the absence of a standardized test methodology that stipulates test conditions such as: input signal activity (dynamic versus static), clock sample rates, error signature characterization, and test vehicle noise filtration.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing

Berg

¹

,

Buchner

²

,

Kim

³

et al. 2010

IEEE Trans. Nucl. Sci.

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Use of code error and beat frequency test method to identify single event upset sensitive circuits in a 1GHz analog to digital converter

Kruckmeyer¹,

Rennie²,

Vignesh³

2007

2007 9th European Conference on Radiation and Its Effects on Components and Systems

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0

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Typical test methods for characterizing the single event upset performance of an analog to digital converter (ADC) have involved holding the input at static values. As a result, output error signatures are seen for only a few input voltage and output codes. A test method using an input beat frequency and output code error detection allows an ADC to be characterized with a dynamic input at a high frequency. With this method, the impact of an ion strike can be seen over the full code range of the output. The error signatures from this testing can provide clues to which area of the ADC is sensitive to an ion strike.

show abstract

Single Event Upset Characterization of GHz Analog to Digital Converters with Dynamic Inputs Using a Beat Frequency Test Method

Cited by 10 publications

References 5 publications

Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter

Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter

Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing

Use of code error and beat frequency test method to identify single event upset sensitive circuits in a 1GHz analog to digital converter

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