Single event upset characterization of the Pentium(R) MMX and Pentium(R) II microprocessors using proton irradiation

Abstract

Experimental single event U set characterization of the Pentium" MMX and Pentium' I1 microprocessors using proton irradiation are presented. Results show the Pentiurn@ 11 processor core cross-section is ten times that of the MMX.

Single-event upset in the PowerPC750 microprocessor

“…This was partly due to the implementation method used in the initial tests, which effectively relied on successful processor operation to identify internal errors. Program "hangs" were also observed in earlier tests of other microprocessor types [1]- [6] and are difficult to deal with.…”

“…Although comparisons of register upset rates are a useful way to examine single-event susceptibility, the more difficult issue is how frequently more complex malfunctions of the processor occur, and how they can be detected and corrected when more complex operating systems are used. Interestingly, these "hangs" were much less frequent than seen for Pentium processors [6], particularly after trapping beam-induced exceptions, program counter hits, and misbranching; it is not clear that these test techniques could be implemented in flight software. Nevertheless, the low space upset rates, combined with reasonable total dose and immunity to latchup and relatively low power consumption, make the PowerPC750 a useful candidate for noncritical, highly computational tasks in space.…”

“…Radiation tests of microprocessors are difficult and costly. Only a few microprocessors have been subjected to radiation tests, and, because of the rapid pace of the commercial processor market, those results are for devices with larger feature sizes and higher operating voltages than current devices [1]- [6]. Of course, some results may exist that are considered proprietary.…”

Characterization of soft errors caused by single event upsets in CMOS processes

“…The measurements on Alpha processors from 0.35m to 0.18m have not indicated a dramatic increase in the total SER [77]. Similarly, 120 MeV proton tests of IA-32 microprocessors did not show a significant increase in SEU cross-sections [97]. However, a rapidly increasing number of bits and growing complexity pose some unique challenges to the design of reliable memories, microprocessors, and other integrated circuits in the future.…”

Single-Event Effects in Low-Cost, Low-Power Microprocessors

“…A number of researchers have looked at radiation effects in COTs microprocessors, including [5]- [8]. Recent publications have studied more modern microprocessors [9], [10] with reduced feature sizes and multiple processing cores.…”