“…1 / f noise has intensively been studied for bulk and thin-film conductors, [9][10][11][12][13][14][15][16][17][18] in particular as a diagnostic tool for the technologically relevant electromigration ͑EM͒ mechanism. [19][20][21][22] Noise at low and high frequencies has also been explored in small constrictions, [23][24][25][26] nanoelectronic devices, 27,28 quantum point contacts, 29 submicron interconnects, 30,31 quantum coherent, quasiballistic and ballistic nanowires, [32][33][34][35][36][37][38][39] and tunneling contacts. 40,41 The power-spectral density of resistance fluctuations S R can phenomenologically be described by Hooge's law, 9,12 …”