2017
DOI: 10.1038/s41598-017-02874-y
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Smooth anti-reflective three-dimensional textures for liquid phase crystallized silicon thin-film solar cells on glass

Abstract: Recently, liquid phase crystallization of thin silicon films has emerged as a candidate for thin-film photovoltaics. On 10 μm thin absorbers, wafer-equivalent morphologies and open-circuit voltages were reached, leading to 13.2% record efficiency. However, short-circuit current densities are still limited, mainly due to optical losses at the glass-silicon interface. While nano-structures at this interface have been shown to efficiently reduce reflection, up to now these textures caused a deterioration of elect… Show more

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Cited by 30 publications
(25 citation statements)
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“…Finally, a 10 nm thin silicon oxide layer is sputtered on all three nanostructure types (1)-(3), serving as a passivation layer at the interface to the silicon absorber. More details can be found in references [4,5]. Silicon layers of 8-10 µm thickness are deposited onto these nanostructured superstrates by electron-beam evaporation at a temperature of 600°C resulting in nano-crystalline material.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Finally, a 10 nm thin silicon oxide layer is sputtered on all three nanostructure types (1)-(3), serving as a passivation layer at the interface to the silicon absorber. More details can be found in references [4,5]. Silicon layers of 8-10 µm thickness are deposited onto these nanostructured superstrates by electron-beam evaporation at a temperature of 600°C resulting in nano-crystalline material.…”
Section: Methodsmentioning
confidence: 99%
“…All three nanotextures are assessed with respect to light trapping properties as well as the material quality of the silicon absorber. The morphologically flat SiO x -TiO x -layer stack is found to overcome the trade-off between optical gain and nanotexture-caused electronic losses best: 8 µm thin silicon solar cell test devices were fabricated exhibiting an excellent material quality with open-circuit voltage values above 640 mV and a short-circuit current density of 23.3 mA cm -2 , corresponding to a relative increase of 11% compared to 21.0 mA cm -2 of simultaneously processed optimized planar reference devices [4].…”
Section: Introductionmentioning
confidence: 99%
“…However, the electronic material quality can be reduced by introducing nano-structures at this interface [2]. Two approaches were recently introduced that combine high electronic material quality LPC silicon with nanostructures, namely the sinusoidal structure [3] and the smooth anti-reflective three-dimensional (SMART) texture [4]. In this contribution, we investigate the angular dependence of the anti-reflective properties of these two structured LPC silicon absorbers compared to an optimized planar reference sample.…”
Section: Introductionmentioning
confidence: 99%
“…(6) 2 and (iii) an atomic force microscopy (AFM) measurement of a sinusoidally nanotextured sol-gel layer on glass with 750 nm pitch and about 150 nm texture height, hence an aspect ratio of about a = 20%. (b) (i) An illustration and (ii) a coloured SEM picture of smooth anti-reflective three-dimensional textures (SMART), 3 which consist of silicon oxide (SiOx) nanopillars in a hexagonal array covered by titanium oxide. SMARTs are characterized by the pitch P [as in (a,ii)], the height h and the filling fraction, given as the surface fraction covered by the SiOx oxide nanopillars.…”
Section: Introductionmentioning
confidence: 99%
“…6 Figure 1 shows two types of periodic nanostructures between glass and LPC-Si, which we recently demonstrated: sinusoidal nanotextures 1,7 and smooth anti-reflective three-dimensional textures (SMART). 3 Both types are fabricated with nanoimprint lithography 8, 9 using high-temperature stable sol-gels, 10 which are suited for the LPC process. LPC-Si solar cells on these textures have excellent material qualities and hence electric properties, such that open circuit voltages exceeding 615 mV or even 640 mV are measured for sinusoidal or SMART structures, respectively.…”
Section: Introductionmentioning
confidence: 99%