Abstract. Recent research efforts in growth of 3C-SiC are reviewed. Sublimation growth is addressed with an emphasis on the enhanced understanding of polytype stability in relation to growth conditions, such as supersaturation and Si/C ratio. It is shown that at low temperature/supersaturation spiral 6H-SiC growth is favored, which prepares the surface for 3C-SiC nucleation. Provided the supersaturation is high enough, 3C-SiC nucleates as two-dimensional islands on terraces of the homoepitaxial 6H-SiC. Effect of different substrate surface preparations is considered. Typical extended defects and their electrical activity is discussed. Finally, possible novel applications are outlined.
IntroductionSilicon carbide (SiC) has been known for long as a semiconductor material with an excellent capability to withstand high voltage, high power and high temperature in electronic switches and rectifiers. As compared to Si, silicon carbide has superior properties which allow making advancement in power and high frequency electronics. SiC is a very interesting material from crystallography and physical perspective. It has been reported to have more than 230 polytypes. Among them two hexagonal structures, 6H and 4H SiC, are most elaborated while the only cubic (3C) polytype is lagging behind in technological developments. The different polytypes can be described by the different ordering of the Si-C bilayers along the c-axis which is the normal to the close packed plane-the cubic{111} or the hexagonal{0001}one. The physical properties of different polytypes vary which imposes stringent conditions to single polytype growth. The development of SiC devices has been mainly based on 4H-SiC which compared to other polytypes has a wider band gap, higher breakdown voltage and higher mobility. However, 3C-SiC is more advantageous for MOSFETs with higher channel mobility since near interface traps are not active in the SiO 2 /3C-SiC system [1]. The reported n-channel mobility of 3C-SiC based MOSFETs is higher than that of 4H-SiC based MOSFETs [2,3]. It is expected that the 3C-based devices will have high energy efficiency and help in fighting with global warming. However, the yield of 3C-SiC based MOSFETs is still low due to the lack of device quality substrates. Hence, progress in crystal growth of 3C-SiC is a key issue for epitaxy and device developments related to this polytype.In this review we are going to present recent advancement in understanding and mastering cubic silicon carbide growth and some unexplored applications of this material.