“…[2] In the past the in situ investigation of catalyst surfaces was difficult, because the most surface sensitive imaging and spectroscopy techniques were restricted to high vacuum conditions. [3,4] Recent instrumental developments however, have made possible the investigations at elevated pressures using imaging [5][6][7][8][9][10] and spectroscopic [11,12,13] methods, among them X-ray photoelectron spectroscopy (XPS) [14,15,16] that has been shown to be able to operate at pressures of up to 10 mbar. [17,18] Here we present the use of XPS at millibar pressures to determine the chemical species near the surface of a catalyst, including the gas phase reaction products, in situ, i.e.…”