Spectroscopic ellipsometry and reflectometry: a user's perspective

Tompkins, Harland G.; Baker, J.; Smith, Steven M.; Convey, Diana

doi:10.1109/leosst.2000.869717

Cited by 117 publications

(165 citation statements)

References 3 publications

Supporting

Mentioning

163

Contrasting

Order By: Relevance

“…The stability of the plasma deposited coatings was assessed by passing the PBS solution through the cell for 10 min prior to the introduction of the protein solution. After introduction of the protein solution there was an immediate shift from the baseline phase (D) signal which relates directly to a change in thickness at the substrate [39]. Spectroscopic data relating to both the change in D and change in W were recorded.…”

Section: In Situ Ellipsometry Analysis Of Protein Adsorptionmentioning

confidence: 99%

Evaluation of Protein Adsorption on Atmospheric Plasma Deposited Coatings Exhibiting Superhydrophilic to Superhydrophobic Properties

et al. 2012

View full text Add to dashboard Cite

Protein adsorption is one of the key parameters influencing the biocompatibility of medical device materials. This study investigates serum protein adsorption and bacterial attachment on polymer coatings deposited using an atmospheric pressure plasma jet system. The adsorption of bovine serum albumin and bovine fibrinogen (Fg) onto siloxane and fluorinated siloxane elastomeric coatings that exhibit water contact angles (θ) ranging from superhydrophilic (θ < 5°) to superhydrophobic (θ > 150°) were investigated. Protein interactions were evaluated in situ under dynamic flow conditions by spectroscopic ellipsometry. Superhydrophilic coatings showed lower levels of protein adsorption when compared with hydrophobic siloxane coatings, where preferential adsorption was shown to occur. Reduced levels of protein adsorption were also observed on fluorinated siloxane copolymer coatings exhibiting hydrophobic wetting behaviour. The lower levels of protein adsorption observed on these surfaces indicated that the presence of fluorocarbon groups have the effect of reducing surface affinity for protein attachment. Analysis of superhydrophobic siloxane and fluorosiloxane surfaces showed minimal indication of protein adsorption. This was confirmed by bacterial attachment studies using a Staphylococcus aureus strain known to bind specifically to Fg, which showed almost no attachment to the superhydrophobic coating after protein adsorption experiments. These results showed the superhydrophobic surfaces to exhibit antimicrobial properties and significantly reduce protein adsorption.

show abstract

Section: In Situ Ellipsometry Analysis Of Protein Adsorptionmentioning

confidence: 99%

Evaluation of Protein Adsorption on Atmospheric Plasma Deposited Coatings Exhibiting Superhydrophilic to Superhydrophobic Properties

et al. 2012

View full text Add to dashboard Cite

show abstract

“…1͑a͔͒. For thin dielectric films, the power of NCM resides in the ability to quantify intrinsic properties, including film thickness 5 and dielectric constant, 6 with lateral spatial resolution well beyond the limit of conventional ellipsometry, reflectance spectroscopy, 7 and capacitance metrology. 8,9 In two recent papers, 6,10 we have demonstrated the quantitative measurement of the dielectric constant and the thickness of thin insulating films at the nanoscale.…”

Section: Introductionmentioning

confidence: 99%

Nanoscale capacitance microscopy of thin dielectric films

Gomila

Toset

Fumagalli

2008

Journal of Applied Physics

109

View full text Add to dashboard Cite

We present an analytical model to interpret nanoscale capacitance microscopy measurements on thin dielectric films. The model displays a logarithmic dependence on the tip-sample distance and on the film thickness-dielectric constant ratio and shows an excellent agreement with finite-element numerical simulations and experimental results on a broad range of values. Based on these results, we discuss the capabilities of nanoscale capacitance microscopy for the quantitative extraction of the dielectric constant and the thickness of thin dielectric films at the nanoscale.

show abstract

“…For example, the measurement of reflection and transmission coefficients [3][4][5][6] and the spectroscopic ellipsometry [7][8][9] lead to refractive index, thickness, and extinction factor measurement.…”

Section: Introductionmentioning

confidence: 99%

Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements

Cardin

Leduc²

2008

Appl. Opt.

View full text Add to dashboard Cite

To cite this version:Julien Cardin, Dominique Leduc. Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements. Applied optics, Optical Society of America, 2008, 47 (7) We present a method of analysis of prism-film coupler spectroscopy based on the use of transfer matrix and genetic algorithm, which allows the simultaneous determination of refractive index, thickness, and optical losses of the measured layer.

show abstract

Spectroscopic ellipsometry and reflectometry: a user's perspective

Cited by 117 publications

References 3 publications

Evaluation of Protein Adsorption on Atmospheric Plasma Deposited Coatings Exhibiting Superhydrophilic to Superhydrophobic Properties

Evaluation of Protein Adsorption on Atmospheric Plasma Deposited Coatings Exhibiting Superhydrophilic to Superhydrophobic Properties

Nanoscale capacitance microscopy of thin dielectric films

Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements

Contact Info

Product

Resources

About