2011
DOI: 10.1117/1.3598162
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Spectroscopic ellipsometry of few-layer graphene

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Cited by 35 publications
(15 citation statements)
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“…The analysis of graphene films by spectroscopic ellipsometry has already been carried out by other groups, and so is fairly well described [2021]. A typical set of spectra of Ψ and Δ of graphene(−)SDS deposited on Si by alternation with PAH are shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The analysis of graphene films by spectroscopic ellipsometry has already been carried out by other groups, and so is fairly well described [2021]. A typical set of spectra of Ψ and Δ of graphene(−)SDS deposited on Si by alternation with PAH are shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The structure utilized in the calculation is shown in the inset of Fig. 3(a), in which a gold nanosphere is placed above a graphene substrate with a separation of d. The dielectric constant of graphene is calculated assuming that the optical response of a single graphene layer is given by the optical sheet conductivity, and the dielectric constant of gold is from the literatures [23,24]. The calculated resonance wavelength as a function of the spacer layer thickness is shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…2(b)). This was taken into account with an island-film model 42,43 for the transfer residue layer on the annealed graphene sample. Figs.…”
Section: Spectroscopic Ellipsometry Measurementsmentioning
confidence: 99%