30th European Microwave Conference, 2000 2000
DOI: 10.1109/euma.2000.338830
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Stability Analysis of Millimeter-Wave Circuits. Application to DC-40GHz PHEMT amplifier and Ku-band HBT power amplifier

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Cited by 6 publications
(3 citation statements)
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“…These types of failures can be minimized by prescreening the MCM (Multi-chip Module) assembly by conducting burn in cycles under bias conditions that could include temperature cycling and vibration. Caution should be used though as burn in tests do not guarantee long life and devices exposed to too high of a temperature for too long a period could have their useful life reduced [ 14].…”
Section: Failure Mechanisms and Junction Temperaturementioning
confidence: 99%
See 1 more Smart Citation
“…These types of failures can be minimized by prescreening the MCM (Multi-chip Module) assembly by conducting burn in cycles under bias conditions that could include temperature cycling and vibration. Caution should be used though as burn in tests do not guarantee long life and devices exposed to too high of a temperature for too long a period could have their useful life reduced [ 14].…”
Section: Failure Mechanisms and Junction Temperaturementioning
confidence: 99%
“…It is one of the few nonlinear stability methods being used and highlights the need for commercial microwave software companies to develop time domain and harmonic balance based non-linear stability tools. NDF based nonlinear tools that rely on an extension of the specific functions for linear stability have been developed by Campovecchio and others but have not found widespread use and implementation into commercially available software packages as of yet [14].…”
Section: Spectrum Analysismentioning
confidence: 99%
“…); • simultaneous optimization of performances in the bandwidth (gain, matching, etc.) and intrinsic linear stability (NDF [11]) from DC to f max using a specific multi-port architecture derived from the 2-port amplifier [12]; • intrinsic nonlinear stability analysis using modifications of the nonlinear model (return ratio) and the generalization of the NDF method to the nonlinear case [13]; • electrothermal nonlinear simulations [14].…”
Section: Third Step: Design Guide For Power Amplifiersmentioning
confidence: 99%