Standardization of proton-induced x-ray emission technique for analysis of thick samples

Abstract

This paper describes the standardization of the proton-induced x-ray emission (PIXE) technique for finding the elemental composition of thick samples. For the standardization, three different samples of standard reference materials (SRMs) were analyzed using this technique and the data were compared with the already known data of these certified SRMs. These samples were selected in order to cover the maximum range of elements in the periodic table. Each sample was irradiated for three different values of collected beam charges at three different times. A proton beam of 2.57 MeV obtained using 5UDH-II Pelletron accelerator was used for excitation of x-rays from the sample. The acquired experimental data were analyzed using the GUPIXWIN software. The results show that the SRM data and the data obtained using the PIXE technique are in good agreement.

Evaluation of Thick Target PIXE Analysis in the 5SDH-2 Pelletron Accelerator Facility at VNU University of Science

“…* Particle-induced X-rays Emission (PIXE) is the elemental analysis techniques using ion beam accelerated by small-sized accelerators [1][2][3]. This method is capable of analyzing quantitatively and simultaneously trace elements from sodium to uranium with many powerful features such as fast and non-destructive analysis, part-per-million sensitivity and low backgrounds [4].…”

Standardization of proton induced X-ray emission for analysis of trace elements in thick samples

“…PIXE has many applications in the study of archaeology, environmental, biological, medicinal and forensic materials [4][5][6][7][8][9]. However, despite the numerous advantages of PIXE technique, standardization or calibration with certified reference materials before each experiments poses a major challenge to most researchers [10]. We report on the standardization of PIXE for accurate analysis of trace elements in thick samples…”