Standing spinwaves in FeMn/NiFe/FeMn exchange-bias structures

Speriosu, V. S.; Parkin, S. S. P.; Wilts, C. H.

doi:10.1109/tmag.1987.1065443

Cited by 43 publications

(23 citation statements)

References 8 publications

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“…4). This linear correlation between the line width and the 1/t NiFe values has also been reported in NiFe/FeMn based EB systems [21] and is attributed to the interfacial nature of the exchange coupling; however, any correlation with the interface structure (i.e. interface roughness) has not been investigated.…”

Section: Nife Thicknesssupporting

confidence: 64%

Ferromagnetic Resonance and X-Ray Reflectivity Studies of Pulsed DC Magnetron Sputtered NiFe/IrMn/CoFe Exchange Bias

Öksüzoğlu¹,

Akman²,

Yıldırım³

et al. 2012

Journal of Magnetics

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Ferromagnetic resonance and X-ray specular reflectivity measurements were performed on Ni 81 Fe 19 /Ir 20 Mn 80 / Co 90 Fe 10 exchange bias trilayers, which were grown using the pulsed-DC magnetron sputtering technique on Si(100)/SiO 2 (1000 nm) substrates, to investigate the evolution of the interface roughness and exchange bias and their dependence on the NiFe layer thickness. The interface roughness values of the samples decrease with increasing NiFe thickness. The in-plane ferromagnetic resonance measurements indicate that the exchange bias field and the peak-to-peak line widths of the resonance curves are inversely proportional to the NiFe thickness. Furthermore, both the exchange bias field and the interface roughness show almost the same dependence on the NiFe layer thickness. The out-of plane angular dependent measurements indicate that the exchange bias arises predominantly from a variation of exchange anisotropy due to changes in interfacial structure. The correlation between the exchange bias and the interface roughness is discussed.

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Section: Nife Thicknesssupporting

confidence: 64%

Ferromagnetic Resonance and X-Ray Reflectivity Studies of Pulsed DC Magnetron Sputtered NiFe/IrMn/CoFe Exchange Bias

Öksüzoğlu¹,

Akman²,

Yıldırım³

et al. 2012

Journal of Magnetics

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show abstract

“…Commonly, the exchange biased thin film exhibits larger line broadening than that of unbiased single layer thin film [9]. It was reported that the line broadening of exchange biased film is caused by a local pinning of FM layer due to an inhomogeneous surface anisotropy based on Malozemoff's model [10]. Thus, the amount of line broadening varies in proportion to exchange coupling strength.…”

Section: Resultsmentioning

confidence: 99%

Influence of spacer layer in exchange coupled NiFe/Cu/IrMn trilayer structure

Yoo¹,

Min²,

Yu³

2006

Journal of Magnetism and Magnetic Materials

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“…Commonly, exchange-biased thin film exhibits larger line broadening than that of unbiased single layer thin film [6]. Speriosu et al reported that the line broadening of exchange-biased film is caused from a local pinning of the FM layer due to an inhomogeneous surface anisotropy based on Malozemoff's model [11]. So, the amount of line broadening varies in proportion to exchange bias strength in FM/AFM thin film.…”

Section: Resultsmentioning

confidence: 99%