Statistical behavior of electrical breakdown in insulating polymers

Wu, Kai; Wang, Yang; Cheng, Yonghong; Dissado, L.A.; Liu, Xiaojun

doi:10.1063/1.3342468

Cited by 30 publications

(17 citation statements)

References 15 publications

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“…9 Recently, Wu et al 10 have proposed a percolation model to describe electric breakdown and ageing in polymers as containing a 3D lattice of electron trap sites. A range of barriers dependent of electric fields were set to simulate electron transfer.…”

Section: Eðdþ ¼ Kdmentioning

confidence: 99%

Origin of thickness dependent dc electrical breakdown in dielectrics

Chen

Zhao

et al. 2012

Applied Physics Letters

157

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Chemisorption on semiconductors: The role of quantum corrections on the space charge regions in multiple dimensions Appl. Phys. Lett. 100, 183106 (2012) Thermal poling of alkaline earth boroaluminosilicate glasses with intrinsically high dielectric breakdown strength J. Appl. Phys. 111, 083519 (2012) Space charge effect in ultrathin ferroelectric films J. Appl. Phys. 111, 084103 (2012) Opto-electric particle manipulation on a bismuth silicon oxide crystal

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Section: Eðdþ ¼ Kdmentioning

confidence: 99%

Origin of thickness dependent dc electrical breakdown in dielectrics

Chen

Zhao

et al. 2012

Applied Physics Letters

157

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“…However, this is in contradiction to the inverse power law typically reported for solid dielectrics which proposes a decrease in dielectric strength with an increase in sample thickness [21]. Recently, the statistical behavior of dielectric breakdown of polymers has been modeled based on the fieldassisted percolation model which represents the amorphous, crystalline and free volume of polymer as a three-dimensional cubic lattice of randomly distributed traps with trap barriers in a certain range [22]. In the presence of an electric field the trap barriers are reduced which facilitates electron transfer and if the field is high enough, a percolation cluster leading to a dielectric breakdown can form across the material volume.…”

Section: Data Selection Threshold ( ) a Minmentioning

confidence: 56%

Effect of Film Thickness and Electrode Area on the Dielectric Breakdown Characteristics of Metallized Capacitor Films

Rytöluoto¹,

Lahti²

2018

NORD-IS

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An alternative approach for measuring breakdown characteristics of metallized and non-metallized polymer films has been previously developed at TUT. The method enables measurement of multiple breakdowns beyond the weakest point of each sample film by utilizing low-energy self-healing breakdown of metallized film. The method yields a large amount of breakdown data even from a relatively small sample area which enables the formation of detailed material-specific breakdown fingerprints. In this paper, some preliminary results of an ongoing further research on the area and thickness dependence of the breakdown characteristics of various polymer films are presented.Dielectric polymer films utilized in film capacitors are subjected to very high electric field stresses and thus, accurate statistical knowledge of their breakdown characteristics at the low breakdown probability region is of utmost importance in order to ensure safe and reliable design and operation in practice [1][2][3][4]. Breakdown measurement is typically realized as a short-term rampto-breakdown measurement and Weibull or other extreme-value distributions are then utilized for statistical analysis of the breakdown data [5]. However, weak spots in the polymer film due to the internal morphology and inherent properties of the polymer itself or due to extrinsic factors such as defects, voids, chemical impurities and non-ideal processing conditions can lead to a large deviation in the breakdown strength [6]. Moreover, the area and volume dispersion of the weak points in the film further complicates the dielectric strength evaluation [7][8][9]. Therefore, a large amount of breakdown data is required from a relatively large test area in order to gain a sufficient statistical relevance for practical applications. One approach for obtaining a large amount of breakdown data is to utilize an automatic breakdown strength measurement system such as in [10][11]. However, especially when the development and optimization phase of new dielectric materials such as polymer nanocomposites is considered, weak spots due to non-ideal processing conditions or other external factors may have a deteriorating effect on the dielectric breakdown strength [12]. Moreover, as the amount of sample material available for breakdown measurement may be scarce, the dielectric breakdown strength determined with only a small number of parallel samples may be misleading as it may be more representative of the weak spots due to extrinsic factors rather than a measure of the inherent properties of the material. Consequently, the true potential of the new dielectric may not be revealed completely. In return to this problem, an alternative approach for measuring breakdown characteristics of thin polymer films has been previously developed at TUT [13]. The method is based on the concept of measuring multiple breakdowns per sample film beyond the weakest point (or dielectric strength) of each film by utilizing lowenergy self-healing breakdown of metallized polymer film which effectively reduces ...

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“…Wu et al [4] have proposed a percolation model to describe electric breakdown and ageing in polymer as containing a 3D lattice of electrons trap sites. A range of barriers dependent of electric fields were set to simulate electron transfer.…”

Section: Existing Theory and Modelmentioning

confidence: 99%

Space charge and thickness dependent dc electrical breakdown of solid dielectrics

Zhao

2012

2012 International Conference on High Voltage Engineering and Application

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A new model based on space charge dynamics under very high dc electric field has been proposed to explain thickness dependent dielectric breakdown. Space charge phenomenon under high electric field has been studied for several decades thanks to the development of new charge mapping techniques. Overwhelming evidences show that the charge packet can be formed in the material under high electric field. The formation and dynamics of the charge packet will result in local electric field enhancement that has a direct impact on breakdown. It has been found that the key factors leading to the formation of charge packet are negative differential mobility and low trapping coefficient. Take these factors into the space charge based model, our simulation results clearly show that the breakdown is dependent on the sample thickness. Through the simulation, it has been noticed that the electrical breakdown field reduction depends on several parameters such as the onset of critical electric field when breakdown occurs. By varying the ramp rate of dc applied voltage, simulation has also shown that the breakdown strength increases with the voltage ramp rate.

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Statistical behavior of electrical breakdown in insulating polymers

Cited by 30 publications

References 15 publications

Origin of thickness dependent dc electrical breakdown in dielectrics

Origin of thickness dependent dc electrical breakdown in dielectrics

Effect of Film Thickness and Electrode Area on the Dielectric Breakdown Characteristics of Metallized Capacitor Films

Space charge and thickness dependent dc electrical breakdown of solid dielectrics

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