2019 IEEE International Electron Devices Meeting (IEDM) 2019
DOI: 10.1109/iedm19573.2019.8993508
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Storage Reliability of Multi-bit Flash Oriented to Deep Neural Network

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Cited by 14 publications
(4 citation statements)
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“…For the MNIST recognition task, the classification of one pattern takes < 1 μs time and ~20 nJ energy -both numbers > 10 3 × better than those of the 28-nm IBM TrueNorth digital chip for the same task at a similar fidelity. Xiang et al also have made an effort at NOR flash-based neuromorphic computing to eliminate the additional analog-to-digital/digital-to-analog (AD/DA) conversion, improve the reliability of multi-bit storage [122,123] . Compared to memristors, flash memory gains much fewer benefits on the cell size, operation voltage, and program/erase endurance although the mature fabrication process and suffers from the same scaling dilemma as a traditional transistor does.…”
Section: Mac Operation In Other Nonvolatile Devicesmentioning
confidence: 99%
“…For the MNIST recognition task, the classification of one pattern takes < 1 μs time and ~20 nJ energy -both numbers > 10 3 × better than those of the 28-nm IBM TrueNorth digital chip for the same task at a similar fidelity. Xiang et al also have made an effort at NOR flash-based neuromorphic computing to eliminate the additional analog-to-digital/digital-to-analog (AD/DA) conversion, improve the reliability of multi-bit storage [122,123] . Compared to memristors, flash memory gains much fewer benefits on the cell size, operation voltage, and program/erase endurance although the mature fabrication process and suffers from the same scaling dilemma as a traditional transistor does.…”
Section: Mac Operation In Other Nonvolatile Devicesmentioning
confidence: 99%
“…The higher degree of freedom of computation puts higher requirements on the memory device, meaning that the device unit should store more states, which is different from the binary switching characteristics. At present, device technologies that can implement multiple state storage include RRAM, [45] PCM, [52] flash, [147] and so on. Usually, a suitable electrical signal such as an accumulated pulse is applied to these memory devices, and the resistance of the device evolves accordingly.…”
Section: Hybrid Precision Digital Computingmentioning
confidence: 99%
“…[14][15][16][17] However, at present, most of the studies concentrate on the prediction model of retention characteristics and error rate of Flash. [18,19] There are few prediction models and corresponding solutions for the endurance and retention of RRAM chips. Iwasaki.…”
Section: Introductionmentioning
confidence: 99%