2015
DOI: 10.1038/srep08130
|View full text |Cite
|
Sign up to set email alerts
|

Strong enhancement of photoresponsivity with shrinking the electrodes spacing in few layer GaSe photodetectors

Abstract: A critical challenge for the integration of optoelectronics is that photodetectors have relatively poor sensitivities at the nanometer scale. Generally, a large electrodes spacing in photodetectors is required to absorb sufficient light to maintain high photoresponsivity and reduce the dark current. However, this will limit the optoelectronic integration density. Through spatially resolved photocurrent investigation, we find that the photocurrent in metal-semiconductor-metal (MSM) photodetectors based on layer… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

5
100
0
1

Year Published

2015
2015
2023
2023

Publication Types

Select...
7
2

Relationship

1
8

Authors

Journals

citations
Cited by 114 publications
(106 citation statements)
references
References 34 publications
5
100
0
1
Order By: Relevance
“…When the laser is incident in the source depletion region of the device, the I ds -V ds curve exhibits a rectifying behavior. 29 To further investigate the modulation of the lateral depletion region length by V ds more directly, we also performed the SPCM studies on another FET device fabricated with a MoS 2 flake of 2.8 nm thick, as shown in Fig. At positive V ds , the source Schottky contact is reverse biased.…”
Section: Resultsmentioning
confidence: 99%
“…When the laser is incident in the source depletion region of the device, the I ds -V ds curve exhibits a rectifying behavior. 29 To further investigate the modulation of the lateral depletion region length by V ds more directly, we also performed the SPCM studies on another FET device fabricated with a MoS 2 flake of 2.8 nm thick, as shown in Fig. At positive V ds , the source Schottky contact is reverse biased.…”
Section: Resultsmentioning
confidence: 99%
“…The Schottky barrier located at contact area can accelerate the separation of photogenerated electron-hole pairs and thus benefi t to photocurrent and also response rate. [ 43,46 ] In summary, for the fi rst time we demonstrated the synthesis of high-quality ultrathin few-layered single-crystalline SnSe 2 fl akes, might enriching the family of 2D semiconducting materials, via an improved CVD method and explored their applications in photodetectors. The utilization of low melting point iodide facilitates the formation of ultrathin …”
Section: Communicationmentioning
confidence: 99%
“…[5][6][7] Recently, the emergence of graphenelike semiconducting materials including black phosphorus, [8] transition metal dichalcogenides (TMDCs), [9,10] GaSe, [11,12] and InSe [13] have well remedied the zero-bandgap disadvantage and attracted tremendous attention. [5][6][7] Recently, the emergence of graphenelike semiconducting materials including black phosphorus, [8] transition metal dichalcogenides (TMDCs), [9,10] GaSe, [11,12] and InSe [13] have well remedied the zero-bandgap disadvantage and attracted tremendous attention.…”
Section: Heterojunction Photodetectorsmentioning
confidence: 99%
“…The photoresponsivity stays a relatively high value over a range λ = 270-740 nm at V ds = −2 V. Interestingly, due to the existing of the built in electrical field between the p-GaSe and n-WS 2 , the device also shows sizeable photoresponsivity at V ds = 0 V over a wavelength range of λ = 270-680 nm, indicating that the device can work in extreme conditions. The characteristic absorption peak located at 410 nm corresponds to the transition from p x and p y -like orbits to the conduction band in the GaSe layer, [12] the other two peaks located at 520 and 630 nm arise from optical transitions involving a spin-orbit split valence band and degenerate conduction band at the K point of the Brillouin zone in the WS 2 layer. We have performed the measurements of photoresponsivity as a function of illumination wavelength with wavelength interval of 10 nm for the new device, as shown in Figure S2 of Supporting Information.…”
Section: Heterojunction Photodetectorsmentioning
confidence: 99%