Strongly code disjoint checkers

Nicolaidis, M.; Courtois, B.

doi:10.1109/12.2217

Cited by 120 publications

(19 citation statements)

References 6 publications

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“…To guarantee system high reliability, similarly to checkers of selfchecking circuits (SCCs) [18], our monitor should check itself with respect to internal faults, and satisfy either the Totally Self-Checking (TSC) [18], or the Strongly Code-Disjoint (SCD) [20] property with respect to such faults. As usual with SCCs, we assume that faults occur one at a time, and that the time elapsing between two following faults is long enough to allow the application of all possible input codewords (i.e., the correct Vout value) [18].…”

Section: Self-checking Abilitymentioning

confidence: 99%

Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection

Omaña

Rossi

Giaffreda

et al. 2013

IEEE Trans. VLSI Syst.

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Section: Self-checking Abilitymentioning

confidence: 99%

Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection

Omaña

Rossi

Giaffreda

et al. 2013

IEEE Trans. VLSI Syst.

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“…Similarly to checkers of self-checking circuits (SCCs) [13], we will verify that our monitor is Totally Self-Checking (TSC) [13], or Strongly Code-Disjoint (SCD) [15], with respect to its internal faults. In particular, we have considered a realistic set of faults (F), composed by all possible node stuck-ats (SAs), transistor stuck-ons (SONs), transistor stuck-opens (SOPs) and resistive bridgings (BFs), with values of connecting resistance (R) in the [0..6kΩ] range [16].…”

Section: Self-checking Abilitymentioning

confidence: 99%

Self-checking monitor for NBTI due degradation

Omaña

Rossi

Bosio

et al. 2010

2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW)

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Abstract-Performance degradation of integrated circuits due to aging e ffects, such as Negative Bia s Temperature Instability (NBTI), i s b ecoming o f gr eat con cern f or current an d f uture CMOS tec hnology. In this p aper we propose a mo nitor able to detect NBTI due late transitions in the com binational part of a critical data-path. It requires lower area than recently proposed alternative solutions, and a lower or comparable pow er consumption. Moreov er, differently f rom alternative solu tions, our monitor i s al so self-checking w ith re spect to it s possible internal faults, thus avoiding the useless negative impact on system performance and the negative impact on system reliability which could otherw ise take plac e in case of non self-c hecking sensors, should they get affected by faults.

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“…Nevertheless, according to [14], in a self-checking scheme there is no need for the checker to be TSC, it suffices that it be strongly code disjoint, according to Definitions D4 and D5 below:…”

Section: Fault Injection Into the Checkermentioning

confidence: 99%

A Self-Checking Scheme to Mitigate Single Event Upset Effects in SRAM-Based FPAAs

Balen

Leite

Kastensmidt

et al. 2009

IEEE Trans. Nucl. Sci.

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Abstract-In this work the problem of Single Event Upset (SEU) is considered in a recent analog technology: The Field Programmable Analog Arrays (FPAAs). Some FPAA models are based on SRAM memory cells to implement the user programmability, which makes this kind of device vulnerable to SEU when employed in applications susceptible to the incidence of radiation. In the former part of this work some fault injection experiments are made in order to investigate the effects of SEU in the SRAM blocks of a commercial FPAA. For this purpose, single bit inversions are injected in the FPAA programming bitstream, when an oscillator module is programmed. In a second moment, a self-checking scheme using the studied FPAA is proposed. This scheme, which is built from the FPAA programming resources, is able to restore the original programming data if an error is detected. Fault injection is also performed to investigate the reliability of the proposed scheme when the bitstream section which controls the checker blocks is corrupted due to a SEU.Index Terms-Field programmable analog arrays, self-checking, self-recovering, single event upset.

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Strongly code disjoint checkers

Cited by 120 publications

References 6 publications

Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection

Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection

Self-checking monitor for NBTI due degradation

A Self-Checking Scheme to Mitigate Single Event Upset Effects in SRAM-Based FPAAs

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