Structural modulation on multilayered bismuth cuprate observed by x-ray reciprocal space mapping

Abstract

Interdependence of elastic strain and segregation in metallic multilayers: An x-ray diffraction study of (111) Au/Ni multilayers J.Lattice-charge stripes and spectral weight near the fermi surface AIP Conf. O x ͑Bi-2201͒ multilayer was investigated by x-ray diffraction methods in order to investigate the effect of internal strain on structural modulation. In multilayered structure, the effect of internal strain is more prominent than in an aliovalent substitution, such as a substitution of La 3+ for Sr 2+ . X-ray reciprocal space mapping ͑XRSM͒ was taken on the -2 plane ͑cross-section XRSM͒ in order to estimate the lattice constants along the in-plane and out-of-plane directions, and -2 scan was used to verify the multilayered structure. Another XRSM method, plan-view XRSM, was employed to verify the in-plane symmetry of structural modulation on theplane. The structural modulation was observed on both the cross-section and plan-view XRSM. The lattice constants together with the modulation vector in multilayer were varied by the multilayer periods without any substitution in the original structure.

Structural modulation in bismuth cuprate superconducting film with continuous epitaxial growth

“…Asymmetric satellite peaks were observed around both symmetric and asymmetric planes on Bi-2212, using BiÀ2212ð0 0 1 2Þ [16], ð0 0 1 6Þ, ð0 0 2 0Þ [10], and ð2 0 1 4Þ, as shown in Fig. 1.…”

“…High-resolution X-ray diffractometer (PANalytival X'Pert PRO MRD) verified epitaxial growth of Bi-2212 film by y-2y scan together with f scan, and revealed asymmetric SC peaks around Bi-2212 main peaks around BiÀ2212ð0 0 2 0Þ [15] and ð0 0 1 2Þ [16]. Two sawtooth functions were taken as a modulation wave, and different wave amplitudes were applied to either whole crystal structure or partially to selected atoms, bismuth or the other atoms, in order to evaluate the effect of displacement of bismuth atoms on SC peaks derived from SC structure.…”

“…Relatively thick films were prepared in the same manner, and investigated by XRD methods. The details in experimental can be found elsewhere [10][11][12]. Contrary to the multilayered structure, thick Bi-2212 films were prepared to investigate the effect of strain in Bi-2212 film.…”

“…Reciprocal space of such structure shows satellite peaks around the main reflection generated by unit cell structure. While symmetric fourfold satellites in intensity and distribution have been observed on single crystal [1][2][3][4][5][6][7][8][9], asymmetric satellite peaks were observed by X-ray reciprocal space mapping (XRSM) on epitaxial thin film [10][11][12].…”

“…However, aliovalent substitution replacing cations with different ion radius might induce internal strain as well as extra oxygen. Since the effect of strain is prominent in multilayered structure, Multilayered Bi-2212/Bi-2201 has been investigated on SC structure by XRSM method [11,12]. Contrary to the multilayered structure, strain in single layer film must be released as film continuously grows.…”