1991
DOI: 10.1557/proc-230-291
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Structure and Characterization of Sputtered Thin Films Based on Lead Titanate.

Abstract: Pure and doped lead-titanate (PT) and lead-zirconate-titanate (PZT) thin films have been deposited on platinum-coated silicon by rf-magnetron sputtering from pressed powder targets. The films have been deposited without substrate heating. The amorphous films were then annealed in an oxygen flow. The structure of the films is tetragonal or rhombohedral depending on composition. The electrical resistivity, dielectric permittivity, ferroelectric hysteresis and pyroelectric coefficient are reported.

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Cited by 4 publications
(7 citation statements)
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“…In between lies the morphotropic phase boundary (MPB), confirming that the composition determines the crystalline structure of the ferroelectric phase. In agreement with observations on films deposited at high substrate temperature [14], the presence of PbO in the target powder has little influence on the film structure except that films sputtered from PbO-enriched targets show smaller concentrations of undesirable phases such as pyrochlore. Investigations of Okuyama et al [49] on PbTiO 3 films deposited on Pt sheet demonstrate that at substrate temperatures of 300 • C < Ts < 450 • C, films have mixed structures of pyrochlore and perovskite types, but those deposited above about 450 • C have the perovskite type (see Table 2 for other processing conditions).…”
Section: Srf2supporting
confidence: 88%
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“…In between lies the morphotropic phase boundary (MPB), confirming that the composition determines the crystalline structure of the ferroelectric phase. In agreement with observations on films deposited at high substrate temperature [14], the presence of PbO in the target powder has little influence on the film structure except that films sputtered from PbO-enriched targets show smaller concentrations of undesirable phases such as pyrochlore. Investigations of Okuyama et al [49] on PbTiO 3 films deposited on Pt sheet demonstrate that at substrate temperatures of 300 • C < Ts < 450 • C, films have mixed structures of pyrochlore and perovskite types, but those deposited above about 450 • C have the perovskite type (see Table 2 for other processing conditions).…”
Section: Srf2supporting
confidence: 88%
“…Numerous researchers have reported on the preparation [ 12 ] and suitability of PT as a pyroelectric sensor [ 13 , 14 ]. Modified PT materials have shown interesting piezoelectric [ 15 ] and pyro-electric properties.…”
Section: Methodsmentioning
confidence: 99%
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