2008
DOI: 10.1007/978-1-4020-8573-4
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Structured Analog CMOS Design

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Cited by 46 publications
(26 citation statements)
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“…The transconductance of M 1 is constrained by the product of the unity gain bandwidth and the load capacitance. g m1 /I 1 is therefore proportional to the ratio of the unity bandwidth and the slew rate [9]. Using the slew rate of 7.5 V/μs and the load capacitance of 100 pF, the g m1 /I 1 is 16.75 S/A.…”
Section: B Input Differential Pairmentioning
confidence: 98%
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“…The transconductance of M 1 is constrained by the product of the unity gain bandwidth and the load capacitance. g m1 /I 1 is therefore proportional to the ratio of the unity bandwidth and the slew rate [9]. Using the slew rate of 7.5 V/μs and the load capacitance of 100 pF, the g m1 /I 1 is 16.75 S/A.…”
Section: B Input Differential Pairmentioning
confidence: 98%
“…v 2 n1 , v 2 n3 , and v 2 n9 are the gate-referred noise of M 1 , M 3 , and M 9 as indicated by (9). A o is the differential gain of the folded cascode, and R out is the output resistance into M 5 and M 7…”
Section: Analysis Of a Folded-cascode Otamentioning
confidence: 99%
“…It offers a good trade-off between power consumption and distortion. More explanations and a detailed study of the OTA can be found in [9] [10]. Knowing that the preamplifier represents more than 50% of the total channel power consumption, the OTA Class-AB architecture seemed to us to be the best choice to develop our charge-sensitive-preamplifier.…”
Section: A Charge Preamplifiermentioning
confidence: 98%
“…In addition, a difference in temperature between two or more transistors inside a die which can be stationary (due to devices at different distance from a heat source) or transient in time (due to a change of ambient temperature that is too fast with respect to the chip thermal time constant) together with variation of process parameters and stress result in gate voltage and current statistical mismatch. A design hint proposed in [132] states "Current mirror mismatch is proportional to g m /I Dsat ratio therefore the most favourable operation region is strong inversion, if the saturation voltage has to be minimized, the design compromise can be either the limit of strong inversion or moderate inversion operation with an increased transistor area".…”
Section: Mismatch Characterizationmentioning
confidence: 99%
“…A larger area reduces the voltage mismatch. In addition, given that the voltage mismatch is inversely proportional to the gm/I Dsat ratio, it decreases if the transistor operates in moderate or weak inversion [132].…”
Section: Mismatch Characterizationmentioning
confidence: 99%