2004
DOI: 10.1116/1.1775002
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Structuring of GaAs. I. Chemical dry etching: Temperature and chlorine pressure dependence of etch rates

Abstract: Articles you may be interested inDirect integration of subwavelength structure on a GaAs solar cell by using colloidal lithography and dry etching process J. Vac. Sci. Technol. B 31, 031202 (2013); 10.1116/1.4798410 Micro-photoluminescence characterizations of GaInAsP/InP single quantum wires fabricated by dry etching and regrowthEtch rates of chemical dry etching ͑CDE͒ of GaAs͑100͒ were determined experimentally in the range from 220 to 475 K and dichlorine pressures up to 0.64ϫ10 Ϫ3 mbar. Model-based underst… Show more

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Cited by 6 publications
(5 citation statements)
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“…The effect of this parameter on the etching is difficult to control because of the competition between Cl 2 dissociative adsorption, Cl 2 desorption, and the chemical etching of GaCl x . As in the chemical etching of GaAs, 23 we observe that the etching rate variation with substrate temperature presents a maximum T M . 23 The increase of the chlorine pressure ͑corresponding to the increase of the chlorine flow rate 20,21 allows to increase the etching rate.…”
Section: A Mesa Structuressupporting
confidence: 51%
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“…The effect of this parameter on the etching is difficult to control because of the competition between Cl 2 dissociative adsorption, Cl 2 desorption, and the chemical etching of GaCl x . As in the chemical etching of GaAs, 23 we observe that the etching rate variation with substrate temperature presents a maximum T M . 23 The increase of the chlorine pressure ͑corresponding to the increase of the chlorine flow rate 20,21 allows to increase the etching rate.…”
Section: A Mesa Structuressupporting
confidence: 51%
“…21,23 The etching rate on the surface element i is given as 21,23 The etching rate on the surface element i is given as…”
Section: Caibe Etching Modelmentioning
confidence: 99%
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“…In Table I, we present our estimated surface energies and those determined by Dienelt et al 11 The physical sputtering yield of the uncovered GaAs surface by chlorine is given as a function of the ion energy and determined by using the TRIM code 13 These values are estimated by minimizing the difference between the experimental and the simulation data concerning the etching rate versus the substrate temperature.…”
Section: A Analytical Modelmentioning
confidence: 99%