2016
DOI: 10.1515/mcma-2016-0106
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Study and simulation of the sputtering process of material layers in plasma

Abstract: Sputtering is characterized by a sputtering yield ratio which depends on several conditions, in particular the incident ions energy to the cathode, in normal incidence and when considers the angle α of the incident ions. Our investigations may be considered in first step to calculate the sputtering yield of three metals: copper, silver, and aluminum collide with argon, xenon, oxygen and nitrogen ions using highly developed software called SRIM (Stopping and Range of Ions in Matter) with normal incidence, then … Show more

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Cited by 10 publications
(6 citation statements)
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“…A surface atom is ejected if its energy exceeds its surface binding energy. To evaluate the number of atoms ejected under ion bombardment, we calculated the sputtering yield Y (E), which quantifies physical sputtering and is defined as the mean number of atoms removed from the surface of a solid per incident ion [2][3][4]52].…”
Section: Sputtering Yield Calculationmentioning
confidence: 99%
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“…A surface atom is ejected if its energy exceeds its surface binding energy. To evaluate the number of atoms ejected under ion bombardment, we calculated the sputtering yield Y (E), which quantifies physical sputtering and is defined as the mean number of atoms removed from the surface of a solid per incident ion [2][3][4]52].…”
Section: Sputtering Yield Calculationmentioning
confidence: 99%
“…Modern technologies and their components, such as cell phones, laptops, and smartwatches, rely on cutting-edge technology to be manufactured. Therefore, they typically require small parts obtained from miniaturized wafers using thin-film technology [1][2][3][4][5].…”
Section: Introductionmentioning
confidence: 99%
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“…To understand the phenomena in plasma and ionized gases, we need to have an exact electron swarm parameter for various electronegative gases. Therefore, considerable attention has been consecrated to studying the physical properties of this gas [6][7][8][9][10].…”
Section: Introductionmentioning
confidence: 99%