2004
DOI: 10.1016/j.jcrysgro.2004.04.077
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Study of different type of dislocations in GaN thin films

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Cited by 10 publications
(7 citation statements)
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“…[25]. The influence of the dislocations on the electronic properties has been widely studied [5,6]. However, the sensitivity of the carrier mobility to the different type of dislocations was rarely studied.…”
Section: Resultsmentioning
confidence: 99%
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“…[25]. The influence of the dislocations on the electronic properties has been widely studied [5,6]. However, the sensitivity of the carrier mobility to the different type of dislocations was rarely studied.…”
Section: Resultsmentioning
confidence: 99%
“…[17] it was reported that the carrier mobility is more sensitive to screw dislocations type and that edge dislocations have not a direct influence on carrier mobility. Yu et al [6] reported that both the screw and edge dislocations affect the carrier mobility. Recently, Zhao et al [26] reported that both electron mobility and carrier concentration are not influenced by the FWHM of o-scan rocking curve for the (00.2) plane, but strongly influenced by the edge dislocations density.…”
Section: Resultsmentioning
confidence: 99%
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“…In this paper, the extrapolation method developed by Srikant et al [10] was used to analyze experimental data. Shi et al [15] and Yu et al [16] have successfully used this method to study the TDs in GaN films. In this method, the rocking curves of five planes are measured for each sample: (0 0 0 2), ð1 01 3Þ, ð1 01 2Þ, ð1 01 1Þ, ð2 02 1Þ.…”
Section: Resultsmentioning
confidence: 99%
“…The mosaicity is defined by the tilt and the twist angle fluctuations that have been already 300 arc-seconds for the tilt and 500 arc-seconds for the twist angle fluctuations, for the GaN grown by OMVPE. [1] However, the mosaicity control for the InN has not been enough up to now in comparison with the GaN system, in spite of many efforts by several research groups [2,3].…”
Section: Introductionmentioning
confidence: 99%