Structural properties of the synthesized TiN thin film on 316L stainless steel (S.S.316L) were studied to determine its potential application as a protective layer for first wall of Tokamaks. For this purpose we deposited TiN on stainless steel 316L (TiN/S.S.316L) via DC magnetron sputtering method and annealing at 700°C. Before and after exposure, samples were analyzed by using scanning electron microscopy (SEM), X-ray diffraction (XRD) and a spectrophotometer. The XRD analysis for studying crystalline structure of samples shows the position and intensity of XRD peaks has changed after exposing to 500 shots of Tokamak. It was found that the S.S.316L sample was severely damaged, its reflection dropped significantly but the SEM images show that plasma exposure has not created any cracks and lines on the surface of the TiN/S.S.316L sample and mass of dust particle has been assembled in some area of the sample.