2013
DOI: 10.1063/1.4808347
|View full text |Cite
|
Sign up to set email alerts
|

Study on the impact of the initialization process on the phase change memory

Abstract: The set processes of T-shape phase change memory (PCRAM) cell are compared to study the change caused by the initialization. After the initialization, PCRAM cell shows lower Vth and minor resistances than those of the 1st operation, which can be explained by the reduction of contact resistance caused by the formation of the crystalline phase change material interface (CPI) near the electrodes. The temperature transition regions between the programmed region and the electrodes preserve the CPI after its formati… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2017
2017
2019
2019

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 16 publications
0
1
0
Order By: Relevance
“…It is well established the reduction in contact resistance leads to improvement in memory cell performance [20][21][22]. On the other hand, device geometry is also known to influence switching and endurance of the memristor devices [22][23][24][25]. This is particularly true for nanowire devices where the contacts are on the wire surface, so that device operation requires charge injection into and out of the wire in addition to scattering in the vicinity of the contacts to effect charge transport along the wire channel itself.…”
Section: Resultsmentioning
confidence: 99%
“…It is well established the reduction in contact resistance leads to improvement in memory cell performance [20][21][22]. On the other hand, device geometry is also known to influence switching and endurance of the memristor devices [22][23][24][25]. This is particularly true for nanowire devices where the contacts are on the wire surface, so that device operation requires charge injection into and out of the wire in addition to scattering in the vicinity of the contacts to effect charge transport along the wire channel itself.…”
Section: Resultsmentioning
confidence: 99%