2011
DOI: 10.1016/j.apsusc.2011.01.056
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Substrate–target distance dependence of structural and optical properties in case of Pb(Zr,Ti)O3 films obtained by pulsed laser deposition

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Cited by 37 publications
(21 citation statements)
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“…At first sight it is therefore surprising that a Zr rich surface oxide shows a distinct core level binding energy with respect to that of Zr in PZT. However, the XPS data in the literature shows that the Zr binding energy is (181.4 ±0.1) eV in PZT [10,24,35,32,36,37,38,39,40,41,42,43,44,45,46] and (182.4 ±0.3) eV in ZrO 2 [47,48,49,50,51,52,53,54,55,56], in excellent agreement with the 1 eV shift measured here. Beyond the immediate chemical environment of the Zr emitter, two other effects may influence the BE shift.…”
Section: Discussionsupporting
confidence: 90%
“…At first sight it is therefore surprising that a Zr rich surface oxide shows a distinct core level binding energy with respect to that of Zr in PZT. However, the XPS data in the literature shows that the Zr binding energy is (181.4 ±0.1) eV in PZT [10,24,35,32,36,37,38,39,40,41,42,43,44,45,46] and (182.4 ±0.3) eV in ZrO 2 [47,48,49,50,51,52,53,54,55,56], in excellent agreement with the 1 eV shift measured here. Beyond the immediate chemical environment of the Zr emitter, two other effects may influence the BE shift.…”
Section: Discussionsupporting
confidence: 90%
“…It is also noted that the spectral peaks of the associated elements of the PLZT became more intense after sputtering the film surface with Ar + ion, as is evident in the XPS spectra. The reported BE and ΔE(Pb) values for Pb in single, highest oxidation state are in close agreement with the values reported in the literature for PZT [26,27] and PLZT [28][29][30].…”
Section: X-ray Photoelectron Spectroscopysupporting
confidence: 90%
“…There is a complex and strong interplay between the application‐oriented properties (piezoelectric coefficient, dielectric constant, and fatigue behavior) and the composition and/or electronic properties of these films 2. Among the methods used to produce epitaxial PZT thin layers, pulsed laser deposition (PLD) is recognized as one of the most appropriate one, since many parameters may be adjusted to control the deposition 3, 4. The surface composition is a crucial parameter for any application involving deposition of metals on dielectrics for contacts.…”
Section: Introductionmentioning
confidence: 99%