2018
DOI: 10.1016/j.mssp.2018.06.021
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Sulfurization temperature dependent physical properties of Cu2SnS3 films grown by a two-stage process

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Cited by 20 publications
(10 citation statements)
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“…MoS 2 on Mo,[41] the residual layer shows a main Raman peak at around 326 cm −1 , distinguished from the features at 338 and 313 cm −1 related to residual kesterite CZTS and a trace amount of SnS 2 residual, respectively [42]. The additional peaks at around 326 cm −1 can be attributed to tetragonal Cu 2 SnS 3 with a Cu/Sn ratio close to the L-CTS phase (Cu/Sn ≈1.83) as obtained from HRTEM [42][43][44][45]. The morphology evolution at different sulfurization stages is shown in Figure3d.…”
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confidence: 69%
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“…MoS 2 on Mo,[41] the residual layer shows a main Raman peak at around 326 cm −1 , distinguished from the features at 338 and 313 cm −1 related to residual kesterite CZTS and a trace amount of SnS 2 residual, respectively [42]. The additional peaks at around 326 cm −1 can be attributed to tetragonal Cu 2 SnS 3 with a Cu/Sn ratio close to the L-CTS phase (Cu/Sn ≈1.83) as obtained from HRTEM [42][43][44][45]. The morphology evolution at different sulfurization stages is shown in Figure3d.…”
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confidence: 69%
“…[ 42 ] The additional peaks at around 326 cm −1 can be attributed to tetragonal Cu 2 SnS 3 with a Cu/Sn ratio close to the L‐CTS phase (Cu/Sn ≈1.83) as obtained from HRTEM. [ 42–45 ] The morphology evolution at different sulfurization stages is shown in Figure 3d. During the sulfurization, CZTS quaternary nanocrystals started to form at t1 (450 °C) within the whole the absorber layer and grew into larger grains at t2 (500 °C), leaving a small‐grain layer between the CZTS large‐grain layer and Mo contact.…”
Section: Resultsmentioning
confidence: 99%
“…The Cu/Sn ratio slightly decreases after the sulfurization process; this is due to the possible diffusion of Sn atoms to the surface of the thin film during the annealing process that increased its concentration and decreased the Cu/Sn ratio from 2.39 to 2.36. [ 68–71 ]…”
Section: Resultsmentioning
confidence: 99%
“…Obtained values of absorption coefficients are higher than >10 4 cm −1 , which promote this material to be used as an absorbance layer for thin‐film‐based solar cells. [ 70 ] On the other hand, optical bandgap ( E g ) values have been evaluated from the empirical equation (Equation (6)) [ 79 ] using graphical plot (see Figure ) of (αhv)2${( {\alpha hv} )^2}$ versus photon energy hv$hv$ αhv2badbreak=A()hvEg$$\begin{equation}{\left( {\alpha hv} \right)^2} = A\left( {hv - {E_{\rm{g}}}} \right)\end{equation}$$…”
Section: Resultsmentioning
confidence: 99%
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