2011
DOI: 10.1103/physrevb.84.075474
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Suppression of the parasitic buffer layer conductance in InSb/AlxIn1xSb heterostructures using a wide-band-gap barrier layer

Abstract: InSb/Al x In 1-x Sb heterostructures display intrinsic parallel conduction in the buffer layer at room temperature that limits exploitation of the high-mobility two-dimensional electron gas (2DEG), particularly for nanostructured devices where deep isolation etch processing is impractical. Here, we demonstrate a strategy to reduce the parasitic conduction by the insertion of a pseudomorphic barrier layer of wide-band-gap alloy below the QW. We have studied the high-field magnetotransport in two types of InSb/A… Show more

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Cited by 10 publications
(12 citation statements)
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“…Cr/Au Ohmic contacts to the InSb 2DEG were formed using a subtractive etch technique. 17 Here, we focus on the results from a w ¼ 2 lm Hall cross structure (SPVM and SGM data from a 1 lm and 4 lm device are presented in the supplementary material 18 ). The RT electrical transport properties of the devices are characterised by an electron density n 0 ¼ 5 Â 10 11 cm…”
mentioning
confidence: 99%
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“…Cr/Au Ohmic contacts to the InSb 2DEG were formed using a subtractive etch technique. 17 Here, we focus on the results from a w ¼ 2 lm Hall cross structure (SPVM and SGM data from a 1 lm and 4 lm device are presented in the supplementary material 18 ). The RT electrical transport properties of the devices are characterised by an electron density n 0 ¼ 5 Â 10 11 cm…”
mentioning
confidence: 99%
“…Further details of the layer structure are given elsewhere. 17 Micro-Hall cross structures with lateral dimensions (w) varying between 1 lm and 4 lm were fabricated using e-beam lithography and shallow (%150 nm etch depth) reactive ion etching in a CH 4 /H 2 gas mixture. Cr/Au Ohmic contacts to the InSb 2DEG were formed using a subtractive etch technique.…”
mentioning
confidence: 99%
“…Considerable advantages would be afforded by pursuing such device concepts in this system; however, to-date, the RT operation of InSb QW nanodevices has been inhibited by excessive buffer layer leakage currents. 7 In this letter, we report the magnetotransport properties of mesoscopic devices fabricated on an InSb/AlInSb QW with a partitioned buffer layer (PBL) scheme 8 designed to suppress the parasitic leakage currents, which demonstrate remarkably clear ballistic transport at 295 K as a result.…”
Section: à2mentioning
confidence: 99%
“…The sample used is a 15-nm modulation doped InSb/ Al x In 1Àx Sb QW grown by MBE onto a GaAs (001) substrate with a PBL scheme (growth details are found elsewhere 8 ). A 15-nm pseudomorphic Al 0.3 In 0.7 Sb layer is incorporated 300 nm below the QW to provide a potential barrier to electrons and holes, thermally generated in the bulk of the buffer layer, from diffusing to the ohmic contact region.…”
Section: à2mentioning
confidence: 99%
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