Bai, Mengjun; Sorokin, A.V.; Thompson, Daniel W.; Poulsen, Matt; Ducharme, Stephen; Herzinger, C.M.; Palto, S.; Fridkin, V.M.; Yudin, S.G.; Savchenko, V.E.; and Gribova, L.K., "Determination of the optical dispersion in ferroelectric vinylidene fluoride (70%)/trifluoroethylene (30%) copolymer Langmuir-Blodgett films" (2004 We report measurements of the optical dispersion in ferroelectric Langmuir-Blodgett films of polyvinylidene fluoride ͑70%͒-trifluoroethylene ͑30%͒ copolymer, using variable-angle spectroscopic ellipsometry over a wide spectral range from infrared to ultraviolet. Film thickness averaged 1.78Ϯ0.07 nm per deposition layer for films ranging from 5 to 125 deposition layers as determined from multi-sample analysis. This deposition rate was consistent with capacitance measurements, yielding a dielectric constant of 9.9Ϯ0.4 normal to the film, by quartz microbalance measurements, and by atomic force microscopy.