1999
DOI: 10.1007/s003390050921
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Surface preparation and characterization of indium tin oxide substrates for organic electroluminescent devices

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Cited by 187 publications
(66 citation statements)
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“…The electroluminescence spectra were collected from the devices polarized at 15 V (Figure 8) and all spectra presented a maximum at 590 nm. In similar experiments carried out by So et al, 1999, the same behavior was also observed.…”
Section: Characterization Of the Pleds Devicessupporting
confidence: 79%
“…The electroluminescence spectra were collected from the devices polarized at 15 V (Figure 8) and all spectra presented a maximum at 590 nm. In similar experiments carried out by So et al, 1999, the same behavior was also observed.…”
Section: Characterization Of the Pleds Devicessupporting
confidence: 79%
“…But, without surface modification of the ITO, PLED devices usually exhibit poor performance. Many surface treatments of the ITO have been employed to improve the device performance, including aqua regia treatment [3], oxygen plasma treatment [4], [5], [6] and [7], atmospheric plasma treatment [8], ultra-violet ozone treatment [9], carbon tetrafluoride/oxygen treatment [10] and various coating treatments such as for example self-assembled monolayers [11] and [12]. Alternatively, by inserting an additional thin layer, such as copper-phtalocyanine [13], polyaniline [14], poly(3,4-ethylene dioxythiophene) doped with polystyrene sulfonate (PEDOT-PSS) [15] and [16], inorganic or organic insulators [17] and [18], emission intensity and device stability can be improved by lowering the driving voltage.…”
Section: Introductionmentioning
confidence: 99%
“…Even if in this case another component could be present on the spectrum, i.e. the oxygen from ITO substrate at 532 eV, 28 we believe that this oxygen component is not detected during the measurements shown in Fig 5. Actually, the ALOISA beamline has a very grazing photon beam setup (6 • of incidence angle), which allows an extremely surface sensitive measurements. All of this brings to the conclusion that the grown ZnO, even if it shows a good crystallinity, is characterized by defects where extra oxygen atoms can be trapped.…”
Section: Xpsmentioning
confidence: 90%
“…• C, in situ, before the photoemission measurements, causing desorption of these groups, which happens at 200 • C. 28 We perform also a quantitative analysis by calculating the total areas of Zn2p (Fig 5(c)) and O1s signal. Taking into account element cross sections and analyzer transmissions at the different kinetic energies at which the two signals are collected, it results in a Zn : O = 1 : 4.7 ratio, suggesting the presence of an extra amount of oxygen.…”
Section: Xpsmentioning
confidence: 99%