2000
DOI: 10.1016/s0039-6028(00)00551-3
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Surface roughening in electrodeposited nickel films on ITO glasses at a low current density

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Cited by 23 publications
(15 citation statements)
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“…4(a) for the case of Cu. We recently showed that the double linear feature of Ni film on ITO could be ascribed to the range of the J value applied [6,11], as only single linearity has been reported till now with the same substrate at quite low applied current density conditions [2,3]. approach.…”
Section: Article In Pressmentioning
confidence: 99%
See 1 more Smart Citation
“…4(a) for the case of Cu. We recently showed that the double linear feature of Ni film on ITO could be ascribed to the range of the J value applied [6,11], as only single linearity has been reported till now with the same substrate at quite low applied current density conditions [2,3]. approach.…”
Section: Article In Pressmentioning
confidence: 99%
“…Nowadays, various exotic conductive materials [1][2][3] are also experimented. Usually, their influence is reported from the study of the deposition method effects so that only the film morphology can be examined in that case [4].…”
Section: Introductionmentioning
confidence: 99%
“…In particular, they are almost non-sensitive to external air and humidity, which make them very applicable. Many authors such as Saitou et al [22,23] and also Gomez et al [24] successfully used this substrate in the electrodeposition of Ni and other metals. We here present a comparative study of the scan rate and substrate effects in the three cases for a particular thickness range of well-coalesced films mostly solicited for the fabrication of various modern devices.…”
Section: Introductionmentioning
confidence: 99%
“…For that reason, the decrease of a(Co) gr from 0.80 to 0.66 with the increase of t bringing its value closer to 0.50 could be a serious indication of a growth process of the same type. Of course, the deviation of a(Co) gr with the decrease of t remains an interesting problem to be clarified, that could be examined in the frame of the textural growth orientation as proposed by Saitou et al [56].…”
Section: Topography and Interface Growth Of The Cobalt Electrodepositsmentioning
confidence: 99%