2011
DOI: 10.1063/1.3656026
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Surface roughness scattering model for arbitrarily oriented silicon nanowires

Abstract: We present an extension of the unscreened generalized Prange-Nee term used to calculate the surface roughness (SR) limited mobility in arbitrarily oriented square nanowires. The presence of non-diagonal terms in the effective mass tensor is responsible for an additional term not considered in previous studies. We assess the impact of such a modification on the SR limited mobility and on the total mobility (SR and phonon scattering are considered) for devices with different orientation and size. We show that th… Show more

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Cited by 23 publications
(19 citation statements)
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“…Figure 7 illustrates how the impact of surface roughness scattering is more pronounced at higher sheet densities, and varies from one width to another, in agreement with published data [2]- [6]. Figure 8 shows the phonon-scattering limited mobility of square, circular, and elliptical nanowires, for different orientations, as a function of the cross section area.…”
Section: Resultssupporting
confidence: 78%
See 1 more Smart Citation
“…Figure 7 illustrates how the impact of surface roughness scattering is more pronounced at higher sheet densities, and varies from one width to another, in agreement with published data [2]- [6]. Figure 8 shows the phonon-scattering limited mobility of square, circular, and elliptical nanowires, for different orientations, as a function of the cross section area.…”
Section: Resultssupporting
confidence: 78%
“…Considerable work has been carried out to evaluate the mobility of Si nanowires, relying mainly on the KuboGreenwood formalism [2]- [4], and to a lesser extent on Monte Carlo and other 1D Boltzmann equation solvers [5], and atomistic simulation methods [6]. However, more work is needed to evaluate the performance potential of NWTs with silicon and alternative material channels at the scaling limit.…”
Section: Introductionmentioning
confidence: 99%
“…Both SR and CO scattering mechanisms are implemented taking into account the tensorial dielectric screening [8], while the phonon interactions remain unscreened. The scattering mechanisms are introduced as described in [8], except for the SR, calculated as in [10], with ∆ sr = 0.5nm and L sr = 1.5nm. The surface charge value employed (N it = 4 × 10 12 cm −2 ) is similar to that used in [11], where such a high value is needed to fit the experimental results.…”
Section: The Modelmentioning
confidence: 99%
“…We adopt the Kubo-Greenwood (KG) formalism [12]- [14], while accounting for the realistic band structure of the NWTs by accurately extracting the effective masses from tight-binding band-structure simulations. This strategy delivers reliable mobility values at low-field near-equilibrium conditions and in devices with strong confinement effects [15].…”
Section: Introductionmentioning
confidence: 99%