2019
DOI: 10.1016/j.cap.2019.01.022
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Switching dynamics and modeling of multi-domain Zr-Doped HfO2 ferroelectric thin films

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Cited by 21 publications
(13 citation statements)
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“…[25] Different domains have different nucleation rates owing to defects at the interface www.advmattechnol.de or in the interior of the polycrystalline ferroelectric thin film. [26][27][28] Therefore, the polarization reversal rate is a distribution rather than a single value. [29,30] Owing to the distributed switching characteristics, the resistance can be varied gradually between the LRS and HRS, and this analog implementation of the resistance state is the factor most directly related to weight implementation, which is the core element of artificial synaptic devices.…”
Section: Resultsmentioning
confidence: 99%
“…[25] Different domains have different nucleation rates owing to defects at the interface www.advmattechnol.de or in the interior of the polycrystalline ferroelectric thin film. [26][27][28] Therefore, the polarization reversal rate is a distribution rather than a single value. [29,30] Owing to the distributed switching characteristics, the resistance can be varied gradually between the LRS and HRS, and this analog implementation of the resistance state is the factor most directly related to weight implementation, which is the core element of artificial synaptic devices.…”
Section: Resultsmentioning
confidence: 99%
“…When the required electric field and time for the polarization to switch are different in each ferroelectric domain, the slope of the electrical current I D with respect to the gate voltage V GS becomes more gradual, for both branches of the hysteresis. This indicates that polarization switching takes place in a sequential manner across all grains (Noh et al, 2019).…”
Section: Multi-domain Characterizationmentioning
confidence: 91%
“…To accurately model the peculiarities of HZO layers, a two-to three-dimensional Ginzburg-Landau-type numerical approach is necessary (Chandra and Littlewood, 2007). Important is that it offers the possibility to explicitly account for the presence of grains displaying different polarization switching properties (Noh et al, 2019). In S-Device, such a model has been incorporated into a classical drift-diffusion solver which is employed to describe the electron and hole transport characteristics of the WO x semiconducting channel and to compute the resulting electrical currents (Selberherr, 1984).…”
Section: Introductionmentioning
confidence: 99%
“…Since the Si: HfO 2 thin film used in this experiment is multi-domain, as shown in the P-V characteristic curve, the polarization switching gradually occurs starting before the coercive voltage (V C ) ( Figure S2, Supporting Information). To express the polarization characteristics of a multi-domain ferroelectric thin film, a normal distribution (Equation 14) is used for the probability density function representing the switching [42]…”
Section: T P Rmentioning
confidence: 99%