Switching performances of 1200 V conventional planar and trench punch-through IGBTs for clamped inductive load under extensive measurements

Azzopardi, Stéphane; Kawamura, Atsuo; Iwamoto, H.

doi:10.1109/ipemc.2000.885332

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Switching performances of 1200 V conventional planar and trench punch-through IGBTs for clamped inductive load under extensive measurements

Cited by 3 publications

References 5 publications

General-purpose clocked gate driver (CGD) IC with programmable 63-level drivability to reduce Ic overshoot and switching loss of various power transistors

General-purpose clocked gate driver (CGD) IC with programmable 63-level drivability to reduce Ic overshoot and switching loss of various power transistors

Effect of the high input capacitance of 1200 V trench IGBT on the switching characteristics under inductive load

General-Purpose Clocked Gate Driver IC With Programmable 63-Level Drivability to Optimize Overshoot and Energy Loss in Switching by a Simulated Annealing Algorithm

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