2016 IEEE Applied Power Electronics Conference and Exposition (APEC) 2016
DOI: 10.1109/apec.2016.7468086
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General-purpose clocked gate driver (CGD) IC with programmable 63-level drivability to reduce Ic overshoot and switching loss of various power transistors

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Cited by 25 publications
(16 citation statements)
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“…The ability to change the gate drive resistance during operation [42], by using an intelligent programmable gate driver [43,44], could also enable this technique of junction temperature sensing without suffering the penalty of increased switching losses. The devices will be driven at high switching rates (using reduced gate drive resistances) and at the occasional instants when junction temperature sensing becomes necessary, a higher gate resistance is used momentarily for monitoring the temperature dependent switching parameters.…”
Section: Results For Condition Monitoring Implementationmentioning
confidence: 99%
“…The ability to change the gate drive resistance during operation [42], by using an intelligent programmable gate driver [43,44], could also enable this technique of junction temperature sensing without suffering the penalty of increased switching losses. The devices will be driven at high switching rates (using reduced gate drive resistances) and at the occasional instants when junction temperature sensing becomes necessary, a higher gate resistance is used momentarily for monitoring the temperature dependent switching parameters.…”
Section: Results For Condition Monitoring Implementationmentioning
confidence: 99%
“…The proposed circuit consists of the protection switch and the active gate controller. The active gate controller provides the variable on-resistance of the protection switch , controlling the gate to source voltage of the switch linearly [12][13][14][15][16]. In this paper, the high frequency buck chopper circuit was applied to the achieve the variable on-resistance for the active gate control.…”
Section: Protection Methodology Using Active Gate Controlledmentioning
confidence: 99%
“…Compared to previously-published work, this SiC active driver arrangement has a higher time resolution and number of drive levels, at the expense of higher complexity and a limited voltage range over which shaping can occur. [15] and [16] present integrated active SiC gate drivers with wide output voltage ranges; however, they are significantly slower. The driver in [15] changes impedance from one switching event to the next, as opposed to during individual switching events.…”
Section: Comparison To Existing Active Gate Driversmentioning
confidence: 99%
“…The driver in [15] changes impedance from one switching event to the next, as opposed to during individual switching events. The driver in [16] has a similar architecture to the active driver used here, but operates at an order-of-magnitude lower internal clock frequency (25 MHz), and is more suited to slower higher-power circuits. It is demonstrated simultaneously improving switching waveforms and reducing losses in a 15-A converter switching 500 V in about 100 ns.…”
Section: Comparison To Existing Active Gate Driversmentioning
confidence: 99%