2017
DOI: 10.1109/ted.2017.2647809
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Symmetric U-Shaped Gate Tunnel Field-Effect Transistor

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Cited by 96 publications
(36 citation statements)
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“…In order to understand the potential of DF-TFET in ultra-low-power applications, Table 2 shows a performance comparison of different TFETs with DF-TFET. Compared to TFETs with a traditional heavily doped p-n tunneling junction [6,20,[32][33][34][35], DF-TFET has obvious advantages on SS and switching ratio. This is due to the characteristics of DF-TFET by using electrostatically doping.…”
Section: Characteristics With Different Parameters and Analog/ Rf mentioning
confidence: 99%
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“…In order to understand the potential of DF-TFET in ultra-low-power applications, Table 2 shows a performance comparison of different TFETs with DF-TFET. Compared to TFETs with a traditional heavily doped p-n tunneling junction [6,20,[32][33][34][35], DF-TFET has obvious advantages on SS and switching ratio. This is due to the characteristics of DF-TFET by using electrostatically doping.…”
Section: Characteristics With Different Parameters and Analog/ Rf mentioning
confidence: 99%
“…But with the continuous progress of voltage scaling down, the unacceptable high-power consumption becomes a serious problem for modern ICs [1,2]. Benefit from the band-to-band tunneling mechanism, tunnel FET (TFET) with steep SS and low-power consumption bring a new solution to this problem and attracted lots of attention [3][4][5][6][7][8][9]. But the applications of conventional silicon-based TFETs are limited by the considerably low on-state current (I ON ), low switching ratio, severe ambipolar effect and large average subthreshold swing (SS) [1,7].…”
Section: Introductionmentioning
confidence: 99%
“…The doping concentration and type of channel region are consistent with the source region and drain region. Meanwhile, the effects of the complex fabrication processes, random doping fluctuations and thermal costs can also be effectively avoided through the charge plasma concept [23].…”
Section: Introductionmentioning
confidence: 99%
“…The tunneling area of the source-channel junction has increased by using structural engineering in such a way that the more carriers are tunneled in the channel region as introduced by L-shaped [23] and U-shaped TFET [21]. Kim et al [24], [25] proposed and experimentally demonstrated the L-shaped TFET for higher ION and smaller SS but at the cost of higher turn-ON voltages. In addition, the tunnel junction cross-sectional area can be increased depending on the gate and source overlaps, in contrast to conventional TFETs [26,27].…”
Section: Introductionmentioning
confidence: 99%