2015
DOI: 10.1002/ppap.201500096
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Synergy Between Plasma‐Assisted ALD and Roll‐to‐Roll Atmospheric Pressure PE‐CVD Processing of Moisture Barrier Films on Polymers

Abstract: The synergy between fast (1600 nm•min -3 -

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Cited by 21 publications
(23 citation statements)
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“…In order to guarantee satisfactory barrier performance levels at high deposition rates, it has very recently been shown by Starostin et al that the application of an ultra‐thin ALD Al 2 O 3 layer (nominally less than 2 nm) on top of the high DDR (HDDR) SiO 2 layer heals the pristine SiO 2 barrier performance, exhibiting a final WVTR of 1 · 10 −3 g · day −1 · m −2 (40 °C and 90% RH) . It is worth mentioning that the ultra‐thin Al 2 O 3 layer by itself exhibits no barrier properties, when applied as single barrier onto the Ca substrate.…”
Section: Introductionmentioning
confidence: 99%
“…In order to guarantee satisfactory barrier performance levels at high deposition rates, it has very recently been shown by Starostin et al that the application of an ultra‐thin ALD Al 2 O 3 layer (nominally less than 2 nm) on top of the high DDR (HDDR) SiO 2 layer heals the pristine SiO 2 barrier performance, exhibiting a final WVTR of 1 · 10 −3 g · day −1 · m −2 (40 °C and 90% RH) . It is worth mentioning that the ultra‐thin Al 2 O 3 layer by itself exhibits no barrier properties, when applied as single barrier onto the Ca substrate.…”
Section: Introductionmentioning
confidence: 99%
“…The use of the buffer layer is potentially responsible for the exceptionally smooth bilayer barriers, as it appears to smoothen the PEN substrate profile in preparation for the bilayer barrier deposition. This buffer layer‐induced substrate smoothening is also known to be an important factor with regard to reducing the gas permeation rate of the final films …”
Section: Resultsmentioning
confidence: 99%
“…The presence of a buffer layer is therefore, vital with regard to achieving the remarkable WVTR performance of the bilayer films, especially at higher input energies. The precise function of the buffer layer is unknown at present, however, it is speculated that the layer could provide a means of mechanical stabilization to the PEN substrate in preparation for the barrier layer deposition, as highlighted by the AFM topographic analysis and in the recent publication by Starostin et al…”
Section: Resultsmentioning
confidence: 99%
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