We review our current progress on semiconductor nanowires of β-Ga 2 O 3 , Si and GaN. These nanowires were grown using both vapor-solid (VS) and vapor-liquid-solid (VLS) mechanisms. Using transmission electron microscopy (TEM) we studied their morphological, compositional and structural characteristics. Here we survey the general morphologies, growth directions and a variety of defect structures found in our samples. We also outline a method to determine the nanowire growth direction using TEM, and present an overview of device fabrication and assembly methods developed using these nanowires.
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Postprint version. Published in Applied Physics
AbstractWe review our current progress on semiconductor nanowires of β-Ga 2 O 3 , Si and GaN. These nanowires were grown using both vapor-solid (VS) and vapor-liquid-solid (VLS) mechanisms. Using transmission electron microscopy (TEM) we studied their morphological, compositional and structural characteristics. Here we survey the general morphologies, growth directions and a variety of defect structures found in our samples.We also outline a method to determine the nanowire growth direction using TEM, and present an overview of device fabrication and assembly methods developed using these nanowires.3